The Electrochemical Society Publisher

publisher of

• Li-Metal Anode in a Conventional Li-Ion Battery Electrolyte: Solid Electrolyte Interphase Formation using Ab Initio Molecular Dynamics.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  169:030502-030502. 2022
• Hydrothermal Synthesis of Co3O4/ZnCo2O4 Core-Shell Nanostructures for High-Performance Supercapacitors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  168:123502-123502. 2021
• (Invited) Designing Fault-Tolerant Interfaces Between Metal Electrodes and Solid Electrolytes.  ECS Meeting Abstracts.  MA2021-02:233-233. 2021
• (Invited) Semi-Solid Alkali Metal Electrodes Enabling High Critical Current Densities and Accessible Areal Capacities in Solid Electrolyte Batteries.  ECS Meeting Abstracts.  MA2021-02:335-335. 2021
• Nanowire-Assisted Photocatalytic Water Disinfection.  ECS Meeting Abstracts.  MA2021-02:672-672. 2021
• Pulse/Pulse Reverse Deposition of NiMo Alloys for Improved Molten Salt Reactor Performance.  ECS Meeting Abstracts.  MA2021-02:796-796. 2021
• Ab Initio Molecular Dynamics of Li-Metal Anode in a Phosphate-Based Electrolyte: Solid Electrolyte Interphase Evolution.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  168:090528-090528. 2021
• Ion Pairing, Clustering and Transport in a LiFSI-TMP Electrolyte as Functions of Salt Concentration using Molecular Dynamics Simulations.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  168:040511-040511. 2021
• Electrolyte Composition Effects on the Formation of the Solid Electrolyte Interphases of Li-Metal Batteries: A Molecular Dynamics Study.  ECS Meeting Abstracts.  MA2021-01:376-376. 2021
• (Invited) Ga2O3 Phase Control and Heterojunctions Using Plasma-Enhanced Atomic Layer Epitaxy.  ECS Meeting Abstracts.  MA2020-02:1654-1654. 2020
• Alloy Plating for Improved Molten Salt Reactor Performance.  ECS Meeting Abstracts.  MA2020-02:1189-1189. 2020
• Metal Capping Layer Effects on Electromigration Failure Phenomena of Plasma Etched Copper Lines.  ECS Journal of Solid State Science and Technology.  9:104009-104009. 2020
• Nanoscale Thin Film Corrosion Barriers Enabled By Multilayer Polymer Clay Nanocomposites.  ECS Meeting Abstracts.  MA2020-02:1339-1339. 2020
• Lithiation of Sulfur-Graphene Compounds Using Reactive Force-Field Molecular Dynamics Simulations.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  167:100555-100555. 2020
• Alloy Plating for Improved Molten Salt Reactor Performance.  ECS Meeting Abstracts.  MA2020-01:1227-1227. 2020
• Si Wafer Dopant Concentration Effect on Light Emission of Solid State Incandescent Light Emitting Devices.  ECS Journal of Solid State Science and Technology.  9:036004-036004. 2020
• Preface—Mathematical Modeling of Electrochemical Systems at Multiple Scales In Honor of Professor Richard Alkire.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  167:010001-010001. 2020
• Creation, Evolution, and Characterization of SEI in Li-Metal Batteries Using Ab Initio Techniques.  ECS Meeting Abstracts.  MA2020-01:280-280. 2020
• Li-Metal Anode in Dilute Electrolyte Lifsi/TMP: Electrochemical Stability Using Ab-Initio and Classical MD Simulations.  ECS Meeting Abstracts.  MA2020-02:3510-3510. 2020
• AlGaN/GaN HEMT And ZnO Nanorod Based Sensors for Chemical and Bio-Applications.  ECS Transactions.  13:53-63. 2019
• GaN and ZnO-Based Sensors for Gas, Nuclear Materials and Chemical Detection.  ECS Transactions.  11:259-270. 2019
• Hydrothermally Grown ZnO Nanorods as Cell Adhesion Control Coating for Implant Devices.  ECS Transactions.  19:147-157. 2019
• Rapid Electrical Detection of Hg(II) Ions with AlGaN/GaN High Electron Mobility Transistors.  ECS Transactions.  11:83-89. 2019
• Real-time Detection of Botulinum Toxin with AlGaN/GaN High Electron Mobility Transistors.  ECS Transactions.  19:123-128. 2019
• c-erbB-2 Sensing Using AlGaN/GaN High Electron Mobility Transistors For Breast Cancer Detection.  ECS Transactions.  19:57-63. 2019
• Operando Atomic Force Microscopy Reveals Mechanics of Structural Water Driven Battery-to-Pseudocapacitor Transition.  ECS Meeting Abstracts.  MA2019-01:2261-2261. 2019
• (Invited)Carbon Nanotube Photoluminescence Solvatochromism in Biomedicine: Spectroscopy, Imaging, and Modulation.  ECS Meeting Abstracts.  2019
• Ab Initio Study of the Interface of the Solid-State Electrolyte Li₉N₂Cl₃with a Li-Metal Electrode.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  2019
• Post Deposition Annealing Atmosphere Effect on Performance of Solid State Incandescent Light Emitting Device.  ECS Journal of Solid State Science and Technology.  7:R3023-R3029. 2018
• Memory Functions of Cadmium Sulfide Embedded Zr-Doped HfO2High-k Dielectrics.  ECS Journal of Solid State Science and Technology.  7:Q97-Q103. 2018
• (Invited) Theory and Device Concepts of Novel Electronic, Optoelectronic, and Topological 2D Materials.  ECS Meeting Abstracts.  MA2018-01:884-884. 2018
• Simulations of a LiF Solid Electrolyte Interphase Cracking on Silicon Anodes Using Molecular Dynamics.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  165:A717-A730. 2018
• (Invited)Diagnosing Turbulent Reactive Flow in Non-Equilibrium Plasma Liquid Systems.  ECS Meeting Abstracts.  MA2018-01:1177-1177. 2018
• (Invited)Molecular Dynamics Simulations of Solid Electrolytes for Li-Ion Nanobatteries.  ECS Meeting Abstracts.  2018
• Cracks and Dendrites in Solid Electrolyte Interphases inLithium-Ion Nanobatteries: Molecular Dynamics Simulations.  ECS Meeting Abstracts.  2018
• Isothermal and Cyclic Oxidation of MoAlB in Air from 1100C to 1400C.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:C930-C938. 2017
• Bio-Molecular Filter for the Capture of Bacterial Pathogens in Liquid Streams.  ECS Transactions.  80:1513-1521. 2017
• Design, Simulation and Fabrication of a Novel Phage Filter for Pathogens Testing from Large Volumes of Water.  ECS Transactions.  80:1523-1530. 2017
• Detection ofSalmonellaEntericawith Magnetoelastic Biosensors in Wash Water Containing Clorox and Chlorine Dioxide.  ECS Transactions.  80:1557-1564. 2017
• Effects of Surface-Scanning Detector Position on the Response of a Wireless Magnetoelastic Biosensor.  ECS Transactions.  80:1579-1583. 2017
• Enhancement in the Capture Efficiency of Magnetoelastic Biosensors forSalmonellaUsing a Dilution Method.  ECS Transactions.  80:1549-1555. 2017
• Rapid PathogenDetection by Surface Swab Sampling and Wireless Biosensing.  ECS Transactions.  80:1531-1539. 2017
• Mathematical Modeling of Electrochemical Systems at Multiple Scales in Honor of Professor John Newman.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:Y13-Y13. 2017
• Application of 2-Dimensional Coil Detector for the Sensitive Direct Salmonella Detection on Plastic Board.  ECS Transactions.  77:1799-1807. 2017
• Dynamics of the Lithiation and Sodiation of Silicon Allotropes: From the Bulk to the Surface.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:A1644-A1650. 2017
• Insights into the Li Intercalation and SEI Formation on LiSi Nanoclusters.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:E3457-E3464. 2017
• Ion Diffusivity through the Solid Electrolyte Interphase in Lithium-Ion Batteries.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:E3159-E3170. 2017
• CommunicationFiltration of Light Emitted from Solid State Incandescent Light Emitting Devices.  ECS Journal of Solid State Science and Technology.  6:Q39-Q41. 2017
• (Invited) Build Effective Cathode Nanocatalysts to Improve Performance of Proton Exchange Membrane Fuel Cells.  ECS Meeting Abstracts.  MA2017-01:1783-1783. 2017
• Experimental and Computational Approaches to Explore the the Mechanisms of Carbon Nanotube Biosensing.  ECS Meeting Abstracts.  2017
• Influence of pin Amorphous Silicon Stack Deposition Sequence on Solar Cell Performance and Degradation.  ECS Journal of Solid State Science and Technology.  6:Q29-Q33. 2017
• Light Emission Enhancement by Embedding Nanocrystalline Cadmium Selenide in Amorphous ZrHfO High-k Dielectric Thin Film Deposited on Silicon Wafer.  ECS Journal of Solid State Science and Technology.  5:Q75-Q80. 2016
• Solar Visible Light Storage on WO3-CdS Heterojunction.  ECS Meeting Abstracts.  MA2016-02:3671-3671. 2016
• Ethylene Carbonate Reduction on Lithiated Surfaces of Hydroxylated Amorphous Silicon Dioxide.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  163:A2197-A2202. 2016
• Investigation of Novel Tunnel Structured Zeta-V2O5 nanowire As a Potential Cathode for Li and Mg Ion Intercalation Using in Situ TEM and Aberration Corrected STEM.  ECS Meeting Abstracts.  MA2016-03:1148-1148. 2016
• Influence of Applied Voltages on Mechanical Properties and In-Vitro Performances of Electroplated Hydroxyapatite Coatings on Pure Titanium.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  163:D305-D308. 2016
• Towards Next Generation Lithium-Sulfur Batteries: Non-Conventional Carbon Compartments/Sulfur Electrodes and Multi-Scale Analysis.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  163:A730-A741. 2016
• Direct Detection of Salmonella on Fresh Produce.  ECS Transactions.  69:25-31. 2015
• Dynamic Mechanical Analysis of Phase Transformations and Anelastic Relaxation in Stabilized Zirconias.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:F14-F22. 2015
• Origin of Excess Irreversible Capacity in Lithium-Ion Batteries Based on Carbon Nanostructures.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:A2106-A2115. 2015
• Atomic Resolution Study of VO2 Metal-Insulator Transition As Field-Effect Transistors.  ECS Meeting Abstracts.  MA2015-01:1368-1368. 2015
• Trapping Polysulfides Catholyte in Carbon Nanofiber Sponges for Improving the Performances of Sulfur Batteries.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:A1396-A1400. 2015
• Dynamic Characterization of Dendrite Deposition and Growth in Li-Surface by Electrochemical Impedance Spectroscopy.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:A687-A696. 2015
• Erratum: Dynamic Mechanical Analysis of Phase Transformations and Anelastic Relaxation in Stabilized Zirconias [J. Electrochem. Soc., 162, F14 (2015)].  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:X9-X9. 2015
• Modeling Electrochemical Decomposition of Fluoroethylene Carbonate on Silicon Anode Surfaces in Lithium Ion Batteries.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:A213-A221. 2014
• Introduction to the Focus Issue on Oxide Thin Film Transistors.  ECS Journal of Solid State Science and Technology.  3:Y5-Y5. 2014
• Interfacial Characterization of Single- and Multi-Walled CNT-Doped Chitosan Scaffolds under Two Flow Conditions.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:H751-H761. 2014
• Factors Affecting Light Emission from Solid State Incandescent Light Emitting Devices with Sputter Deposited Zr-Doped HfO₂Thin Films.  ECS Journal of Solid State Science and Technology.  3:Q182-Q189. 2014
• Enhanced-Ion Transfer via Metallic-Nanopore Electrodes.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:A1475-A1479. 2014
• Mathematical Modeling of Electrochemical Systems at Multiple Scales.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:Y9-Y9. 2014
• DFT Study of Reduction Mechanisms of Ethylene Carbonate and Fluoroethylene Carbonate on Li⁺-Adsorbed Si Clusters.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:E3097-E3109. 2014
• (Invited) An X-Band Class-E Power Amplifier with MEMS Output Impedance Tuner.  ECS Transactions.  60:1121-1126. 2014
• Boron-Based Nanoparticles for Chemical-Mechanical Polishing of Copper Films.  ECS Journal of Solid State Science and Technology.  2:P20-P25. 2013
• Temperature Effects on Nanocrystalline Molybdenum Oxide Embedded ZrHfO High-kNonvolatile Memory Functions.  ECS Journal of Solid State Science and Technology.  2:Q16-Q22. 2013
• Memristive Devices For Computing: Mechanisms, Applications And Challenges.  ECS Meeting Abstracts.  MA2013-02:2214-2214. 2013
• Electroluminescence from Metal Oxide Thin Films.  ECS Solid State Letters.  2:Q59-Q61. 2013
• In Situ Spectroscopic Measurements of Individual Cation and Anion Dynamics in a RuO₂Electrochemical Capacitor.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  160:A862-A868. 2013
• SEI Layer Formation On Si Anodes.  ECS Meeting Abstracts.  MA2013-02:901-901. 2013
• A Voltammetry Study of Ethanol Oxidation on Carbon Supported, Non Alloyed Platinum-Tungsten Catalysts.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  160:H185-H191. 2013
• Thin Film Transistor Technology--Past, Present, and Future.  Interface magazine.  22:55-61. 2013
• Managing Basal Plane Dislocations in SiC: Perspective and Prospects.  ECS Meeting Abstracts.  MA2012-02:2523-2523. 2012
• Concurrent Reaction and Plasticity During Initial Lithiation of Crystalline Silicon in Lithium-Ion Batteries.  ECS Meeting Abstracts.  MA2012-01:967-967. 2012
• Charge Trapping and Detrapping in nc-RuO Embedded ZrHfO High-k Thin Film for Nonvolatile Memory Applications.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:H214-H219. 2012
• Concurrent Reaction and Plasticity during Initial Lithiation of Crystalline Silicon in Lithium-Ion Batteries.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:A238-A243. 2012
• Memory Functions of Molybdenum Oxide Nanodots-Embedded ZrHfO High-k.  ECS Electrochemistry Letters.  15:H192-H192. 2012
• Memory Functions of Nanocrystalline ITO Embedded Zirconium-Doped Hafnium Oxide High-kCapacitor with ITO Gate.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:H595-H598. 2012
• Publisher's Note: Long-Term Oxidation of Ti₂AlC in Air and Water Vapor at 10001300C Temperature Range [J. Electrochem. Soc., 159, C90 (2012)].  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:S9-S9. 2012
• Electrolysis of Molten Iron Oxide with an Iridium Anode: The Role of Electrolyte Basicity.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  158:E101-E101. 2011
• Hybrid DFT Functional-Based Static and Molecular Dynamics Studies of Excess Electron in Liquid Ethylene Carbonate.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  158:A400-A400. 2011
• Long-Term Oxidation of Ti₂AlC in Air and Water Vapor at 10001300C Temperature Range.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:C90-C96. 2011
• Ruthenium Modified Zr-Doped HfO2 High-k Thin Films with Low Equivalent Oxide Thickness.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  158:G162-G162. 2011
• Single- and Dual-Layer Nanocrystalline Indium Tin Oxide Embedded ZrHfO High-k Films for Nonvolatile Memories Material and Electrical Properties.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  158:H756-H756. 2011
• Temperature Influence on Nanocrystals Embedded High-k Nonvolatile CV Characteristics.  ECS Electrochemistry Letters.  14:H50-H50. 2011
• (Invited) Microscale Plasma Discharges in Aqueous Solutions: New Technique for Localized Synthesis of Nanoparticles.  ECS Meeting Abstracts.  MA2010-01:1128-1128. 2010
• Evaluation of Fluorine Ion Concentration in TiO[sub 2] NT Anodization Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  157:K125-K125. 2010
• Hysteresis of Transfer Characteristics of Floating-Gate a-Si:H Thin Film Transistor Nonvolatile Memories.  ECS Electrochemistry Letters.  13:H460-H460. 2010
• Nonvolatile Memories with Dual-Layer Nanocrystalline ZnO Embedded Zr-Doped HfO[sub 2] High-k Dielectric.  ECS Electrochemistry Letters.  13:H83-H83. 2010
• Numerical Investigation of Mechanical Durability in Polymer Electrolyte Membrane Fuel Cells.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  157:B705-B705. 2010
• Role of Iridium in Pt-based Alloy Catalysts for the ORR: Surface Adsorption and Stabilization Studies.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  157:B959-B959. 2010
• Biosensors Using Functionalized ZnO and GaN Surfaces.  ECS Meeting Abstracts.  MA2009-01:576-576. 2009
• A Theoretical-Experimental Approach for the Design of Biomimetic Materials for Electrochemical Sensing.  ECS Meeting Abstracts.  MA2009-02:1633-1633. 2009
• Graphene Ribbon Devices from Unzipped Carbon Nanotubes.  ECS Meeting Abstracts.  MA2009-02:2791-2791. 2009
• Electromigration of Flat and Bent Copper Lines Patterned with a Plasma-Based Etch Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  156:H579-H579. 2009
• Macrophage Adhesion and Viability on Zinc Oxide Nanorods.  ECS Meeting Abstracts.  MA2008-02:2351-2351. 2008
• Nanoheteroepitaxy for Mass-Manufacturable Electronics and Photonics without Crystalline Substrates.  ECS Meeting Abstracts.  MA2008-02:2054-2054. 2008
• ZnO Nanorods for Controlling Cell Behavior.  ECS Meeting Abstracts.  MA2008-02:2361-2361. 2008
• Additive-Gas Effects on Cl[sub 2] Plasma-Based Copper-Etch Process and Sidewall Attack.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  155:H97-H97. 2008
• Grain-Size Effect on a Plasma-Based Copper Etch Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  155:H432-H432. 2008
• Nanocrystalline Zinc-Oxide-Embedded Zirconium-Doped Hafnium Oxide for Nonvolatile Memories.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  155:H386-H386. 2008
• GaN and ZnO-Based Sensors for Gas, Nuclear Materials and Chemical Detection.  ECS Meeting Abstracts.  MA2007-02:1343-1343. 2007
• An Isothermal Annealing Study of Spontaneous Morphology Change in Electrodeposited Copper Metallization.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  154:D103-D103. 2007
• Memory Functions of Amorphous Silicon-Based Floating Gate MIS Capacitors.  ECS Electrochemistry Letters.  10:H232-H232. 2007
• Memory Functions of Nanocrystalline Indium Tin Oxide Embedded Zirconium-Doped Hafnium Oxide MOS Capacitors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  154:H887-H887. 2007
• Reactive Ion Etching of Titanium Tungsten Thin Films.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  154:H653-H653. 2007
• Selective Detection of Hg(II) Ions from Cu(II) and Pb(II) Using AlGaN∕GaN High Electron Mobility Transistors.  ECS Electrochemistry Letters.  10:J150-J150. 2007
• Zirconium-Doped Hafnium Oxide High-k Dielectrics with Subnanometer Equivalent Oxide Thickness by Reactive Sputtering.  ECS Electrochemistry Letters.  10:H199-H199. 2007
• Hafnium-Doped Tantalum Oxide High-k Gate Dielectrics.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  153:G410-G410. 2006
• Integration of an Amorphous Silicon Thin Film Transistor with a Microchannel Electrophoresis for Protein Identification.  ECS Electrochemistry Letters.  9:J21-J21. 2006
• Ab Initio and Classical Molecular Dynamics Studies of the Dilithium Phthalocyanine/Pyrite Interfacial Structure.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:A1955-A1955. 2005
• Effect of Amorphous Si Quantum-Dot Size on 1.54 μm Luminescence of Er.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:G445-G445. 2005
• Evaluation of Nontoxic Polymer Coatings with Potential Biofoul Release Properties Using EIS.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:B236-B236. 2005
• Hydrogenation Effect on the Er Luminescence in Amorphous Silicon Quantum Dot Films.  ECS Electrochemistry Letters.  8:G63-G63. 2005
• Influence of a 5A Tantalum Nitride Interface Layer on Dielectric Properties of Zirconium-Doped Tantalum Oxide High-k Films.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:G617-G617. 2005
• Suppression of Crystallization of Tantalum Oxide Thin Film by Doping with Zirconium.  ECS Electrochemistry Letters.  8:G27-G27. 2005
• Zirconium-Doped Tantalum Oxide Gate Dielectric Films Integrated with Molybdenum, Molybdenum Nitride, and Tungsten Nitride Gate Electrodes.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:G643-G643. 2005
• Composite Cathode with Li[sub 2]Pc.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  151:A1338-A1338. 2004
• Electrical and Physical Characterization of Zirconium-Doped Tantalum Oxide Thin Films.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  151:F59-F59. 2004
• UPS of Boron-Sulfur Co-Doped, n-Type Diamond.  ECS Electrochemistry Letters.  7:G331-G331. 2004
• Long Time Oxidation Study of Ti[sub 3]SiC[sub 2], Ti[sub 3]SiC[sub 2]/SiC, and Ti[sub 3]SiC[sub 2]/TiC Composites in Air.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  150:B166-B166. 2003
• Stability of Ultrashallow Junction Formed by Low-Energy Boron Implant and Spike Annealing.  ECS Electrochemistry Letters.  6:G82-G82. 2003
• Effect of Sample Configuration on AMTEC Electrode/Electrolyte Characteristics Measurements in a Sodium Exposure Test Cell.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  149:A1432-A1432. 2002
• Investigation of Wells-Dawson Heteropoly Oxofluorotungstates by Scanning Tunneling Microscopy and Tunneling Spectroscopy.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  149:E117-E117. 2002
• Point Defect Engineering and Its Application in Shallow Junction Formation.  ECS Electrochemistry Letters.  5:G93-G93. 2002
• Chlorine Plasma/Copper Reaction in a New Copper Dry Etching Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  148:G524-G524. 2001
• Microchannel Electrophoresis Device for Separation and In Situ Detection of Proteins.  ECS Electrochemistry Letters.  4:H23-H23. 2001
• Molecular Dynamics Study of Graphite/Electrolyte Interfaces.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  148:A624-A624. 2001
• A LatticeGas Model Study of Lithium Intercalation in Graphite.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  146:3630-3638. 1999
• Theoretical Studies of Lithium Perchlorate in Ethylene Carbonate, Propylene Carbonate, and Their Mixtures.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  146:3613-3622. 1999
• High Temperature Reactive Ion Etching of IndiumTin Oxide with HBr and CH4 Mixtures.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  145:4313-4317. 1998
• Computational Studies of Lithium Intercalation in Model Graphite in the Presence of Tetrahydrofuran.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  145:3328-3334. 1998
• High Temperature Reactive Ion Etching of IndiumTin Oxide.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  144:1411-1416. 1997
• Horizontally Redundant, SplitGate aSi:H Thin Film Transistors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  143:2680-2682. 1996
• Titanium Nitridation on Copper Surfaces.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  143:2349-2353. 1996
• Nonphotosensitive, Vertically Redundant TwoChannel aSi:H Thin Film Transistor.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  143:1469-1471. 1996
• Plasma Etching and Deposition for aSi:H Thin Film Transistors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  142:2486-2507. 1995
• PECVD Silicon Nitride as a Gate Dielectric for Amorphous Silicon Thin Film Transistor: Process and Device Performance.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  142:186-190. 1995
• Thin Film Transistors with Graded SiN x Gate Dielectrics.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  141:1061-1065. 1994
• Reactive Ion Etch Processes for Amorphous Silicon Thin Film Transistors: A Based Chemistry.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  141:502-506. 1994
• The Role of GasPhase Reactions in Modeling of the ForcedFlow Chemical Vapor Infiltration Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  140:2121-2124. 1993
• Electrochemical and Conversion Electron Mössbauer Studies of Low Carbon Steel Polarized in Aqueous Sulfate Solution Containing Sulfite in Low Concentration.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  139:1301-1305. 1992
• A Selfaligned, Trilayer, aSi:H Thin Film Transistor Prepared from Two Photomasks.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  139:1199-1204. 1992
• Reactive Ion Etching of PECVD n+ aSi:H: Plasma Damage to PECVD Silicon Nitride Film and Application to Thin Film Transistor Preparation.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  139:548-552. 1992
• Reactive Ion Etching of Sputter Deposited Tantalum Oxide and Its Etch Selectivity to Tantalum.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  139:579-583. 1992
• A New Process Using Two PhotoMasks to Prepare Trilayer Thin Film Transistors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  138:637-638. 1991
• Factors Affecting the Molybdenum Line Slope by Reactive Ion Etching.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  137:1907-1911. 1990
• Reactive Ion Etching of PECVD Amorphous Silicon and Silicon Nitride Thin Films with Fluorocarbon Gases.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  137:1235-1239. 1990
• The Effect of a High Voltage Corona‐Discharge on Electroactive Pt‐Polymer Composites.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  134:2802-2804. 1987
• Structural and Thermodynamic Properties of Cointercalated Titanium Disulfide.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  133:1966-1970. 1986
• The Extent of the Phenomenon of Oscillatory Anion Incorporation in Alumina Barrier Films.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  132:3065-3066. 1985
• Analysis of InP Surface Prepared by Various Cleaning Methods.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  129:447-448. 1982
• Auger Electron Spectroscopy Study of GaAs Substrate Cleaning Procedures.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  129:406-408. 1982
• Electrical and Optical Characteristics of SSI-LED Made from Capacitor Containing Tri-Layer WOx Embedded Zr-Doped HfOx Gate Dielectric.  ECS Journal of Solid State Science and Technology. 126001-126001. 2021
• Study of Electrothermal Characteristics and Emitted Light Characteristics of SSI-LED.  ECS Journal of Solid State Science and Technology. 065017-065017. 2020
• Communication—Co-Planar Structured Nano-Resistor Devices.  ECS Journal of Solid State Science and Technology. Q223-Q225. 2019
• Capping Layer Effect on Lifetime of Plasma Etched Copper Lines.  ECS Transactions. 87-92. 2019
• Co-Planar Nano-Resistor Devices.  ECS Transactions. 71-76. 2019
• Lifetime of Plasma Etched Copper Lines.  ECS Transactions. 65-72. 2019
• Nano-resistor Based Devices – Effects of Size, Structure, and Performance.  ECS Transactions. 171-176. 2019
• (Invited) Illumination Light Wavelength Effects on Double-Gate a-IGZO Thin Film Transistor with Top-Gate-to-Source/Drain Offset Structure.  ECS Transactions. 147-152. 2018
• Electromigration of Plasma Etched Copper Lines of Various Widths and Lengths.  ECS Transactions. 41-47. 2018
• Enhancement of SSI-LED Light Emission by Embedding CdS in the Zr-Doped HfO2High-kFilm.  ECS Transactions. 53-58. 2018
• Plasma-Based Copper Etch Process and Reliability.  ECS Transactions. 165-170. 2018
• Substrate Effect on Light Emission of SSI-LEDs.  ECS Transactions. 191-197. 2017
• Effect of Incident Light Direction and Metallic Reflector Layer on Light Sensing of Amorphous Silicon Pin Diodes.  ECS Transactions. 1753-1759. 2017
• (Invited) Multifunctional Amorphous Metal Oxide Thin Films Structure Transformation for Various Functions.  ECS Transactions. 21-29. 2017
• Failure Mechanism of Nano-Resistor Devices.  ECS Transactions. 79-83. 2017
• Resistivity and Barrier Height of Nano-Resistors Made from Zr-Doped HfO ₂ High- K Dielectric on Si Wafer.  ECS Transactions. 63-68. 2017
• Narrowing of Broad Band Light Emitted from a SSI-LED.  ECS Transactions. 17-22. 2017
• Nonvolatile Memory Characteristics of CdS Embedded Zr-Doped HfO₂ High-k Dielectric MOS Capacitors.  ECS Transactions. 11-17. 2016
• Temperature Effects on Charge Storage and Transfer of Nanocrystalline CdSe Embedded Zr-Doped HfO₂MOS Memory Device.  ECS Journal of Solid State Science and Technology. Q231-Q238. 2016
• Effect of n ⁺ Layer Deposition Power on Light Sensing of Amorphous Silicon pin Diodes.  ECS Transactions. 33-39. 2016
• Light Sensing of a-Si:H P in Diode - Wavelength and Intensity Effects.  ECS Transactions. 15-20. 2016
• (Invited) A Metal Oxide Antifuse-Diode Device.  ECS Transactions. 23-29. 2015
• Post Deposition Annealing Atmosphere Effect on SSI-LEDs Made of Zr-Doped HfO₂ High-k Gate Dielectric.  ECS Transactions. 17-22. 2015
• (Invited) A Diode-Like Antifuse Device Made of High-K Dielectric.  ECS Transactions. 183-189. 2015
• (Gordon E. Moore Medal for Outstanding Achievement in Solid State Science and Technology) Research on Nano and Giga Electronics Breakthroughs Along the Path.  ECS Transactions. 139-154. 2015
• (Invited) Temperature Influence on Current Leakage and Hysteresis of Nc-CdSe Embedded Zr-Doped HfO₂ High-k Dielectric Nonvolatile Memory.  ECS Transactions. 195-202. 2015
• Solid State Incandescent Light Emitting Device Made of WO_x Embedded Zr-Doped HfO₂ High-k Stack on Si.  ECS Transactions. 223-228. 2015
• White-Light Emission SSI-LED Made of Sputter Deposited TiO_x Thin Film on Si Wafer.  ECS Transactions. 1-6. 2015
• Post Deposition Annealing Temperature Effect on White-Light Emitting of WO_x Thin Film Stack on Si.  ECS Transactions. 1-6. 2014
• (Invited) Thin Film Transistors as Driving Devices for Attached Devices.  ECS Transactions. 145-153. 2014
• Temperature Effect on Memory Functions of the nc-CdSe Embedded ZrHfO High-k MOS Device.  ECS Transactions. 125-131. 2014
• Highly Doped Conjugated Polymers for Electrochemical Energy Storage.  ECS Meeting Abstracts. 288-288. 2014
• Electrochemical, Catalytic and O₂-Permeation Studies of Iron-Doped Barium Zirconates for Membrane Reactor Applications.  ECS Transactions. 307-318. 2014
• Light Wavelength Effects on Charge Trapping and Detrapping of AlO_x Embedded ZrHfO High-K Stack.  ECS Transactions. 169-175. 2014
• White-Light Emission from Amorphous ZrHfO Thin Film Dielectrics with and without Embedded Nanocrystalline CdSe Dots.  ECS Transactions. 55-60. 2014
• CdSe Embedded ZrHfO Gate Dielectric Nonvolatile Memories Charge Trapping and Breakdown Studies.  ECS Transactions. 109-113. 2013
• Light Wavelength Effect on Tungsten Oxide Dielectric Properties.  ECS Transactions. 259-263. 2013
• Memristive Devices for Computing: Mechanisms, Applications and Challenges.  ECS Transactions. 9-14. 2013
• (Invited) Metal Oxide High-k Thin Films from Gate Dielectrics to Nonvolatile Memories to LEDs.  ECS Transactions. 273-281. 2013
• (Invited) Nanocrystals Embedded High-k Nonvolatile Memories Bulk Film and Nanocrystal Material Effects.  ECS Transactions. 121-128. 2013
• Electrochemical Characterization of UNS N08367 and UNS S31603 Alloys in Presence of Chloride and Bromide Solutions.  ECS Transactions. 227-240. 2013
• Managing Basal Plane Dislocations in SiC: Perspective and Prospects.  ECS Transactions. 103-108. 2013
• Nanocrystalline MoO_x Embedded ZrHfO High-k Memories - Charge Trapping and Retention Characteristics.  ECS Transactions. 203-209. 2012
• Light Effects on Charge Trapping and Detrapping of nc-ZnO Embedded ZrHfO High-k MOS Nonvolatile Memories.  ECS Transactions. 93-100. 2011
• Super Proton Conductive Nafion Nanofibers: Discovery, Fabrication, Properties, and Fuel Cell Performance.  ECS Transactions. 1503-1506. 2011
• (Invited) Nonvolatile Memories for Nano and Giga Electronics.  ECS Transactions. 157-166. 2011
• Material and Electrical Properties of Hole-Trapping Memory Capacitors Composed of nc-ITO Embedded ZrHfO High-k Films.  ECS Transactions. 249-255. 2011
• Status Review of Nanocrystals Embedded High-K Nonvolatile Memories.  ECS Transactions. 13-31. 2011
• (Invited) Mechanism and Performance of Floating-Gate a-Si:H TFT Nonvolatile Memory Devices.  ECS Transactions. 357-364. 2010
• (Invited) Performance and Reliability of Nanocrystals Embedded High-k Nonvolatile Memories.  ECS Transactions. 425-430. 2010
• Stability of Iridium Anode in Molten Oxide Electrolysis for Ironmaking: Influence of Slag Basicity.  ECS Transactions. 219-230. 2010
• Stress-Induced Deterioration of Nanocrystalline ITO Embedded ZrHfO High-k Nonvolatile Memories.  ECS Transactions. 307-311. 2010
• Water Transport in Proton Exchange Membranes: Insights from Time-Resolved Infrared Spectroscopy.  ECS Transactions. 1029-1033. 2010
• Hole-Trapping Mechanism and SILC of Dual-Layer nc-ITO Embedded ZrHfO High-k Nonvolatile Memories.  ECS Transactions. 269-276. 2010
• Low Energy of Activation Lithium-ion Conducting Channel.  ECS Transactions. 163-167. 2010
• Failure Analysis of Single and Dual nc-ITO Embedded ZrHfO High-k Nonvolatile Memories.  ECS Transactions. 457-464. 2009
• Surface Adsorption and Stabilization Effect of Iridium in Pt-based Alloy Catalysts for PEM Fuel Cell Cathodes.  ECS Transactions. 1037-1044. 2009
• A-Si:H TFT Nonvolatile Memories and Copper Interconnect for Rigid and Flexible Electronics.  ECS Transactions. 183-190. 2009
• Dipole Model Explaining High-k/Metal Gate Threshold Voltage Tuning.  ECS Transactions. 269-276. 2009
• Single and Dual nc-ITO and nc-ZnO Embedded ZrHfO High-k Nonvolatile Memories.  ECS Transactions. 81-87. 2009
• Temperature Influence on Nanocrystals Embedded High-k Nonvolatile Memory Characteristics.  ECS Transactions. 41-47. 2009
• The Challenges in Introducing PMOS Dual Channel in CMOS Processing.  ECS Transactions. 223-231. 2009
• Embedding of Nanocrystalline Ruthenium in ZrHfO High-k Film for Nonvolatile Memories.  ECS Transactions. 465-470. 2008
• Investigation of Stress and Water Distribution in Membrane Electrode Assembly (MEA) During Fuel Cell Operation.  ECS Transactions. 551-561. 2008
• Mechanism of Charge Storage in nc-RuO Embedded ZrHfO High-k Films.  ECS Transactions. 309-316. 2008
• Reliability of a-Si:H TFTs and Copper Interconnect Lines for Flexible Electronics.  ECS Transactions. 345-351. 2008
• A Modular Fuel Cell, Modular DC-DC Converter Concept for High Performance and Enhanced Reliability.  ECS Transactions. 603-608. 2008
• Critical Components of FinFet Integration: Examining the Density Trade-off and Process Integration for FinFET Implementation.  ECS Transactions. 331-338. 2007
• Nonvolatile Memories Based on Nanocrystalline Zinc Oxide Embedded Zirconium-doped Hafnium Oxide Thin Films.  ECS Transactions. 509-518. 2007
• Electrochemical Characterization of X80 Steel under Sour Environments and Addition of Imidazoline Based Compounds Under Linear Flow Conditions.  ECS Transactions. 181-198. 2007
• Radiation Exposure Effect on Amorphous Silicon Thin Film Transistors.  ECS Transactions. 261-266. 2007
• ULSIC vs. TFT - What Can They Learn from Each Other?.  ECS Transactions. 45-50. 2007
• ELECTRONICS AND PHOTONICS DIVISION AWARD ADDRESS: Thin Film Transistor and ULSIC Technologies - Parallel or Crossing?.  ECS Transactions. 121-132. 2007
• Influence of Ru Dopant on the Dielectric Properties of Zr-doped HfO2 High-k Thin Film.  ECS Transactions. 121-127. 2007
• A Scalable Method for the Synthesis of Metal Oxide Nanowires.  ECS Transactions. 97-105. 2006
• Indium-Tin-Oxide Embedded in Zirconium-Doped Hafnium Oxide High-k Dielectric Films for Hole-Based Nonvolatile Memories.  ECS Transactions. 193-201. 2006
• Mixed Oxide High-k Gate Dielectrics - Interface Layer Structure, Breakdown Mechanism, and Memories.  ECS Transactions. 253-263. 2006
• Nonvolatile Amorphous Silicon Thin Film Transistor Memories with the a-Si:H Embedded Gate Dielectric Structure.  ECS Transactions. 333-339. 2006
• Bulk and Interface Material and Electrical Properties of Hafnium-Doped Tantalum Oxide High-K Films.  ECS Transactions. 177-183. 2006
• Control of Edge Shape, Sidewall Profile, and Sidewall Roughness of the Plasma Etched Copper.  ECS Transactions. 169-176. 2006
• Dissolution and Inhibition Mechanism of 1018 Steel in Simulated Cooling Water by Adding Phosphononoacetic Acid Compound under Two Flow Conditions.  ECS Transactions. 223-240. 2006
• Sub 2 nm Thick Zirconium Doped Hafnium Oxide High-K Gate Dielectrics.  ECS Transactions. 447-454. 2006