The Electrochemical Society Publisher

publisher of

• Ion Pairing, Clustering and Transport in a LiFSI-TMP Electrolyte as Functions of Salt Concentration using Molecular Dynamics Simulations.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  168:040511-040511. 2021
• Ab Initio Molecular Dynamics of Li-Metal Anode in a Phosphate-Based Electrolyte: Solid Electrolyte Interphase Evolution.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  168:090528-090528. 2021
• Electrolyte Composition Effects on the Formation of the Solid Electrolyte Interphases of Li-Metal Batteries: A Molecular Dynamics Study.  ECS Meeting Abstracts.  MA2021-01:376-376. 2021
• Pulse/Pulse Reverse Deposition of NiMo Alloys for Improved Molten Salt Reactor Performance.  ECS Meeting Abstracts.  MA2021-02:796-796. 2021
• Alloy Plating for Improved Molten Salt Reactor Performance.  ECS Meeting Abstracts.  MA2020-02:1189-1189. 2020
• Li-Metal Anode in Dilute Electrolyte Lifsi/TMP: Electrochemical Stability Using Ab-Initio and Classical MD Simulations.  ECS Meeting Abstracts.  MA2020-02:3510-3510. 2020
• Metal Capping Layer Effects on Electromigration Failure Phenomena of Plasma Etched Copper Lines.  ECS Journal of Solid State Science and Technology.  9:104009-104009. 2020
• Lithiation of Sulfur-Graphene Compounds Using Reactive Force-Field Molecular Dynamics Simulations.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  167:100555-100555. 2020
• Alloy Plating for Improved Molten Salt Reactor Performance.  ECS Meeting Abstracts.  MA2020-01:1227-1227. 2020
• Creation, Evolution, and Characterization of SEI in Li-Metal Batteries Using Ab Initio Techniques.  ECS Meeting Abstracts.  MA2020-01:280-280. 2020
• Si Wafer Dopant Concentration Effect on Light Emission of Solid State Incandescent Light Emitting Devices.  ECS Journal of Solid State Science and Technology.  9:036004-036004. 2020
• Preface—Mathematical Modeling of Electrochemical Systems at Multiple Scales In Honor of Professor Richard Alkire.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  167:010001-010001. 2020
• (Invited) Ga 2 O 3 Phase Control and Heterojunctions Using Plasma-Enhanced Atomic Layer Epitaxy.  ECS Meeting Abstracts.  MA2020-02:1654-1654. 2020
• AlGaN/GaN HEMT And ZnO Nanorod Based Sensors for Chemical and Bio-Applications.  ECS Transactions.  13:53-63. 2019
• GaN and ZnO-Based Sensors for Gas, Nuclear Materials and Chemical Detection.  ECS Transactions.  11:259-270. 2019
• Hydrothermally Grown ZnO Nanorods as Cell Adhesion Control Coating for Implant Devices.  ECS Transactions.  19:147-157. 2019
• Rapid Electrical Detection of Hg(II) Ions with AlGaN/GaN High Electron Mobility Transistors.  ECS Transactions.  11:83-89. 2019
• Real-time Detection of Botulinum Toxin with AlGaN/GaN High Electron Mobility Transistors.  ECS Transactions.  19:123-128. 2019
• c-erbB-2 Sensing Using AlGaN/GaN High Electron Mobility Transistors For Breast Cancer Detection.  ECS Transactions.  19:57-63. 2019
• Ab Initio Study of the Interface of the Solid-State Electrolyte Li9N2Cl3 with a Li-Metal Electrode.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  166:a2048-a2057. 2019
• Memory Functions of Cadmium Sulfide Embedded Zr-Doped HfO2 High-k Dielectrics.  ECS Journal of Solid State Science and Technology.  7:q97-q103. 2018
• Simulations of a LiF Solid Electrolyte Interphase Cracking on Silicon Anodes Using Molecular Dynamics.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  165:a717-a730. 2018
• Post Deposition Annealing Atmosphere Effect on Performance of Solid State Incandescent Light Emitting Device.  ECS Journal of Solid State Science and Technology.  7:r3023-r3029. 2018
• Isothermal and Cyclic Oxidation of MoAlB in Air from 1100°C to 1400°C.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:c930-c938. 2017
• Bio-Molecular Filter for the Capture of Bacterial Pathogens in Liquid Streams.  ECS Transactions.  80:1513-1521. 2017
• Design, Simulation and Fabrication of a Novel Phage Filter for Pathogens Testing from Large Volumes of Water.  ECS Transactions.  80:1523-1530. 2017
• Effects of Surface-Scanning Detector Position on the Response of a Wireless Magnetoelastic Biosensor.  ECS Transactions.  80:1579-1583. 2017
• Enhancement in the Capture Efficiency of Magnetoelastic Biosensors for Salmonella Using a Dilution Method.  ECS Transactions.  80:1549-1555. 2017
• Mathematical Modeling of Electrochemical Systems at Multiple Scales in Honor of Professor John Newman.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:y13-y13. 2017
• Application of 2-Dimensional Coil Detector for the Sensitive Direct Salmonella Detection on Plastic Board.  ECS Transactions.  77:1799-1807. 2017
• Dynamics of the Lithiation and Sodiation of Silicon Allotropes: From the Bulk to the Surface.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:a1644-a1650. 2017
• Insights into the Li Intercalation and SEI Formation on LiSi Nanoclusters.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:e3457-e3464. 2017
• Ion Diffusivity through the Solid Electrolyte Interphase in Lithium-Ion Batteries.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  164:e3159-e3170. 2017
• Communication—Filtration of Light Emitted from Solid State Incandescent Light Emitting Devices.  ECS Journal of Solid State Science and Technology.  6:q39-q41. 2017
• Detection of Salmonella Enterica with Magnetoelastic Biosensors in Wash Water Containing Clorox and Chlorine Dioxide.  ECS Transactions.  80:1557-1564. 2017
• Rapid Pathogen Detection by Surface Swab Sampling and Wireless Biosensing.  ECS Transactions.  80:1531-1539. 2017
• Influence of pin Amorphous Silicon Stack Deposition Sequence on Solar Cell Performance and Degradation.  ECS Journal of Solid State Science and Technology.  6:q29-q33. 2017
• Ethylene Carbonate Reduction on Lithiated Surfaces of Hydroxylated Amorphous Silicon Dioxide.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  163:a2197-a2202. 2016
• Electrochemical Impedance Spectroscopy Optimization on Passive Metals.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  163:c470-c476. 2016
• Influence of Applied Voltages on Mechanical Properties and In-Vitro Performances of Electroplated Hydroxyapatite Coatings on Pure Titanium.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  163:d305-d308. 2016
• Towards Next Generation Lithium-Sulfur Batteries: Non-Conventional Carbon Compartments/Sulfur Electrodes and Multi-Scale Analysis.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  163:a730-a741. 2016
• Light Emission Enhancement by Embedding Nanocrystalline Cadmium Selenide in Amorphous ZrHfO High-k Dielectric Thin Film Deposited on Silicon Wafer.  ECS Journal of Solid State Science and Technology.  5:q75-q80. 2016
• Direct Detection of Salmonella on Fresh Produce.  ECS Transactions.  69:25-31. 2015
• Origin of Excess Irreversible Capacity in Lithium-Ion Batteries Based on Carbon Nanostructures.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:a2106-a2115. 2015
• Trapping Polysulfides Catholyte in Carbon Nanofiber Sponges for Improving the Performances of Sulfur Batteries.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:a1396-a1400. 2015
• Dynamic Characterization of Dendrite Deposition and Growth in Li-Surface by Electrochemical Impedance Spectroscopy.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:a687-a696. 2015
• Erratum: Dynamic Mechanical Analysis of Phase Transformations and Anelastic Relaxation in Stabilized Zirconias [J. Electrochem. Soc., 162, F14 (2015)].  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:x9-x9. 2015
• Dynamic Mechanical Analysis of Phase Transformations and Anelastic Relaxation in Stabilized Zirconias.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  162:f14-f22. 2015
• Introduction to the Focus Issue on Oxide Thin Film Transistors.  ECS Journal of Solid State Science and Technology.  3:y5-y5. 2014
• Interfacial Characterization of Single- and Multi-Walled CNT-Doped Chitosan Scaffolds under Two Flow Conditions.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:h751-h761. 2014
• Factors Affecting Light Emission from Solid State Incandescent Light Emitting Devices with Sputter Deposited Zr-Doped HfO2 Thin Films.  ECS Journal of Solid State Science and Technology.  3:q182-q189. 2014
• Enhanced-Ion Transfer via Metallic-Nanopore Electrodes.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:a1475-a1479. 2014
• Mathematical Modeling of Electrochemical Systems at Multiple Scales.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:y9-y9. 2014
• DFT Study of Reduction Mechanisms of Ethylene Carbonate and Fluoroethylene Carbonate on Li+-Adsorbed Si Clusters.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:e3097-e3109. 2014
• (Invited) An X-Band Class-E Power Amplifier with MEMS Output Impedance Tuner.  ECS Transactions.  60:1121-1126. 2014
• Modeling Electrochemical Decomposition of Fluoroethylene Carbonate on Silicon Anode Surfaces in Lithium Ion Batteries.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  161:a213-a221. 2014
• Electroluminescence from Metal Oxide Thin Films.  ECS Solid State Letters.  2:q59-q61. 2013
• In Situ Spectroscopic Measurements of Individual Cation and Anion Dynamics in a RuO2 Electrochemical Capacitor.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  160:a862-a868. 2013
• Engineering the Abio-Bio Interface to Enable More than Moore in Functional Bioelectronics.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  160:b60-b65. 2013
• A Voltammetry Study of Ethanol Oxidation on Carbon Supported, Non Alloyed Platinum-Tungsten Catalysts.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  160:h185-h191. 2013
• Temperature Effects on Nanocrystalline Molybdenum Oxide Embedded ZrHfO High-k Nonvolatile Memory Functions.  ECS Journal of Solid State Science and Technology.  2:q16-q22. 2013
• Thin Film Transistor Technology—Past, Present, and Future.  Electrochemical Society Interface.  22:55-61. 2013
• Boron-Based Nanoparticles for Chemical-Mechanical Polishing of Copper Films.  ECS Journal of Solid State Science and Technology.  2:p20-p25. 2012
• Charge Trapping and Detrapping in nc-RuO Embedded ZrHfO High-k Thin Film for Nonvolatile Memory Applications.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:h214-h219. 2012
• Concurrent Reaction and Plasticity during Initial Lithiation of Crystalline Silicon in Lithium-Ion Batteries.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:a238-a243. 2012
• Memory Functions of Molybdenum Oxide Nanodots-Embedded ZrHfO High-k.  Electrochemical and Solid-State Letters.  15:h192-h194. 2012
• Memory Functions of Nanocrystalline ITO Embedded Zirconium-Doped Hafnium Oxide High-k Capacitor with ITO Gate.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:h595-h598. 2012
• Publisher's Note: Long-Term Oxidation of Ti2AlC in Air and Water Vapor at 1000–1300°C Temperature Range [J. Electrochem. Soc., 159, C90 (2012)].  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:s9-s9. 2012
• Hybrid DFT Functional-Based Static and Molecular Dynamics Studies of Excess Electron in Liquid Ethylene Carbonate.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  158:a400-a410. 2011
• Long-Term Oxidation of Ti2AlC in Air and Water Vapor at 1000–1300°C Temperature Range.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  159:c90-c96. 2011
• Ruthenium Modified Zr-Doped HfO2 High-k Thin Films with Low Equivalent Oxide Thickness.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  158:g162-g168. 2011
• Single- and Dual-Layer Nanocrystalline Indium Tin Oxide Embedded ZrHfO High-k Films for Nonvolatile Memories – Material and Electrical Properties.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  158:h756-h762. 2011
• Temperature Influence on Nanocrystals Embedded High-k Nonvolatile C – V Characteristics.  Electrochemical and Solid-State Letters.  14:h50-h52. 2011
• Evaluation of Fluorine Ion Concentration in TiO2 NT Anodization Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  157:k125-k130. 2010
• Hysteresis of Transfer Characteristics of Floating-Gate a-Si:H Thin Film Transistor Nonvolatile Memories.  Electrochemical and Solid-State Letters.  13:h460-h463. 2010
• Nonvolatile Memories with Dual-Layer Nanocrystalline ZnO Embedded Zr-Doped HfO2 High-k Dielectric.  Electrochemical and Solid-State Letters.  13:h83-H86. 2010
• Numerical Investigation of Mechanical Durability in Polymer Electrolyte Membrane Fuel Cells.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  157:b705-b713. 2010
• Role of Iridium in Pt-based Alloy Catalysts for the ORR: Surface Adsorption and Stabilization Studies.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  157:b959-b963. 2010
• Electromigration of Flat and Bent Copper Lines Patterned with a Plasma-Based Etch Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  156:h579-h584. 2009
• Additive-Gas Effects on Cl2 Plasma-Based Copper-Etch Process and Sidewall Attack.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  155:h97-h102. 2008
• Grain-Size Effect on a Plasma-Based Copper Etch Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  155:h432-h437. 2008
• Nanocrystalline Zinc-Oxide-Embedded Zirconium-Doped Hafnium Oxide for Nonvolatile Memories.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  155:h386-h389. 2008
• Reactive Ion Etching of Titanium Tungsten Thin Films.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  154:h653-h658. 2007
• An Isothermal Annealing Study of Spontaneous Morphology Change in Electrodeposited Copper Metallization.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  154:d103-d112. 2007
• Memory Functions of Amorphous Silicon-Based Floating Gate MIS Capacitors.  Electrochemical and Solid-State Letters.  10:h232-H234. 2007
• Memory Functions of Nanocrystalline Indium Tin Oxide Embedded Zirconium-Doped Hafnium Oxide MOS Capacitors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  154:h887-h893. 2007
• Selective Detection of Hg ( II )  Ions from Cu ( II )  and Pb ( II )  Using AlGaN ∕ GaN High Electron Mobility Transistors.  Electrochemical and Solid-State Letters.  10:j150-j153. 2007
• Zirconium-Doped Hafnium Oxide High-k Dielectrics with Subnanometer Equivalent Oxide Thickness by Reactive Sputtering.  Electrochemical and Solid-State Letters.  10:h199-H202. 2007
• Hafnium-Doped Tantalum Oxide High-k Gate Dielectrics.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  153:g410-g416. 2006
• Integration of an Amorphous Silicon Thin Film Transistor with a Microchannel Electrophoresis for Protein Identification.  Electrochemical and Solid-State Letters.  9:j21-j23. 2006
• Ab Initio and Classical Molecular Dynamics Studies of the Dilithium Phthalocyanine/Pyrite Interfacial Structure.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:a1955-a1962. 2005
• Effect of Amorphous Si Quantum-Dot Size on 1.54 μm Luminescence of Er.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:g445-g447. 2005
• Evaluation of Nontoxic Polymer Coatings with Potential Biofoul Release Properties Using EIS.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:b236-B243. 2005
• Hydrogenation Effect on the Er Luminescence in Amorphous Silicon Quantum Dot Films.  Electrochemical and Solid-State Letters.  8:g63-g64. 2005
• Influence of a 5 Å Tantalum Nitride Interface Layer on Dielectric Properties of Zirconium-Doped Tantalum Oxide High-k Films.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:g617-g622. 2005
• Suppression of Crystallization of Tantalum Oxide Thin Film by Doping with Zirconium.  Electrochemical and Solid-State Letters.  8:g27-G29. 2005
• Zirconium-Doped Tantalum Oxide Gate Dielectric Films Integrated with Molybdenum, Molybdenum Nitride, and Tungsten Nitride Gate Electrodes.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  152:g643-g650. 2005
• Composite Cathode with Li[sub 2]Pc.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  151:a1338-A1338. 2004
• Electrical and Physical Characterization of Zirconium-Doped Tantalum Oxide Thin Films.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  151:f59-f67. 2004
• UPS of Boron-Sulfur Co-Doped, n-Type Diamond.  Electrochemical and Solid-State Letters.  7:g331-g334. 2004
• Long Time Oxidation Study of Ti[sub 3]SiC[sub 2], Ti[sub 3]SiC[sub 2]/SiC, and Ti[sub 3]SiC[sub 2]/TiC Composites in Air.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  150:b166-B166. 2003
• Stability of Ultrashallow Junction Formed by Low-Energy Boron Implant and Spike Annealing Problem and Solution.  Electrochemical and Solid-State Letters.  6:g82-g84. 2003
• Effect of Sample Configuration on AMTEC Electrode/Electrolyte Characteristics Measurements in a Sodium Exposure Test Cell.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  149:a1432-A1436. 2002
• Investigation of Wells-Dawson Heteropoly Oxofluorotungstates by Scanning Tunneling Microscopy and Tunneling Spectroscopy.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  149:e117-E124. 2002
• Point Defect Engineering and Its Application in Shallow Junction Formation.  Electrochemical and Solid-State Letters.  5:g93-g95. 2002
• Chlorine Plasma/Copper Reaction in a New Copper Dry Etching Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  148:g524-G529. 2001
• Microchannel Electrophoresis Device for Separation and In Situ Detection of Proteins.  Electrochemical and Solid-State Letters.  4:h23-H25. 2001
• Molecular Dynamics Study of Graphite/Electrolyte Interfaces.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  148:a624-A624. 2001
• A Lattice‐Gas Model Study of Lithium Intercalation in Graphite.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  146:3630-3638. 1999
• Theoretical Studies of Lithium Perchlorate in Ethylene Carbonate, Propylene Carbonate, and Their Mixtures.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  146:3613-3622. 1999
• High Temperature Reactive Ion Etching of Indium‐Tin Oxide with HBr and  CH 4 Mixtures.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  145:4313-4317. 1998
• Computational Studies of Lithium Intercalation in Model Graphite in the Presence of Tetrahydrofuran.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  145:3328-3334. 1998
• High Temperature Reactive Ion Etching of Indium‐Tin Oxide.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  144:1411-1416. 1997
• Horizontally Redundant, Split‐Gate a‐Si:H Thin Film Transistors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  143:2680-2682. 1996
• Titanium Nitridation on Copper Surfaces.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  143:2349-2353. 1996
• Nonphotosensitive, Vertically Redundant Two‐Channel a‐Si:H Thin Film Transistor.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  143:1469-1471. 1996
• Plasma Etching and Deposition for a‐Si:H Thin Film Transistors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  142:2486-2507. 1995
• PECVD Silicon Nitride as a Gate Dielectric for Amorphous Silicon Thin Film Transistor Process and Device Performance.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  142:186-190. 1995
• Thin Film Transistors with Graded SiN x Gate Dielectrics.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  141:1061-1065. 1994
• Reactive Ion Etch Processes for Amorphous Silicon Thin Film Transistors A Based Chemistry.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  141:502-506. 1994
• The Role of Gas‐Phase Reactions in Modeling of the Forced‐Flow Chemical Vapor Infiltration Process.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  140:2121-2124. 1993
• A Self‐aligned, Trilayer, a‐Si:H Thin Film Transistor Prepared from Two Photomasks.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  139:1199-1204. 1992
• Reactive Ion Etching of PECVD n+ a‐Si:H Plasma Damage to PECVD Silicon Nitride Film and Application to Thin Film Transistor Preparation.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  139:548-552. 1992
• Reactive Ion Etching of Sputter Deposited Tantalum Oxide and Its Etch Selectivity to Tantalum.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  139:579-583. 1992
• A New Process Using Two Photo‐Masks to Prepare Trilayer Thin Film Transistors.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  138:637-638. 1991
• Factors Affecting the Molybdenum Line Slope by Reactive Ion Etching.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  137:1907-1911. 1990
• Reactive Ion Etching of PECVD Amorphous Silicon and Silicon Nitride Thin Films with Fluorocarbon Gases.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  137:1235-1239. 1990
• The Effect of a High Voltage Corona‐Discharge on Electroactive Pt‐Polymer Composites.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  134:2802-2804. 1987
• Structural and Thermodynamic Properties of Cointercalated Titanium Disulfide.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  133:1966-1970. 1986
• The Extent of the Phenomenon of Oscillatory Anion Incorporation in Alumina Barrier Films.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  132:3065-3066. 1985
• Analysis of InP Surface Prepared by Various Cleaning Methods.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  129:447-448. 1982
• Auger Electron Spectroscopy Study of GaAs Substrate Cleaning Procedures.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  129:406-408. 1982
• Electrodissolution Kinetics of Nickel in Concentrated Acidic Chloride Solutions.  JOURNAL OF THE ELECTROCHEMICAL SOCIETY.  126:1118-1123. 1979
• Study of Electrothermal Characteristics and Emitted Light Characteristics of SSI-LED.  ECS Journal of Solid State Science and Technology. 065017-065017. 2020
• (Invited) Mechanism and Performance of Floating-Gate a-Si:H TFT Nonvolatile Memory Devices.  ECS Transactions. 357-364. 2019
• (Invited) Nonvolatile Memories for Nano and Giga Electronics.  ECS Transactions. 157-166. 2019
• (Invited) Performance and Reliability of Nanocrystals Embedded High-k Nonvolatile Memories.  ECS Transactions. 425-430. 2019
• A Modular Fuel Cell, Modular DC-DC Converter Concept for High Performance and Enhanced Reliability.  ECS Transactions. 603-608. 2019
• A Scalable Method for the Synthesis of Metal Oxide Nanowires.  ECS Transactions. 97-105. 2019
• A-Si:H TFT Nonvolatile Memories and Copper Interconnect for Rigid and Flexible Electronics.  ECS Transactions. 183-190. 2019
• Bulk and Interface Material and Electrical Properties of Hafnium-Doped Tantalum Oxide High-K Films.  ECS Transactions. 177-183. 2019
• Control of Edge Shape, Sidewall Profile, and Sidewall Roughness of the Plasma Etched Copper.  ECS Transactions. 169-176. 2019
• Critical Components of FinFet Integration: Examining the Density Trade-off and Process Integration for FinFET Implementation.  ECS Transactions. 331-338. 2019
• Dipole Model Explaining High-k/Metal Gate Threshold Voltage Tuning.  ECS Transactions. 269-276. 2019
• Dissolution and Inhibition Mechanism of 1018 Steel in Simulated Cooling Water by Adding Phosphononoacetic Acid Compound under Two Flow Conditions.  ECS Transactions. 223-240. 2019
• ELECTRONICS AND PHOTONICS DIVISION AWARD ADDRESS: Thin Film Transistor and ULSIC Technologies - Parallel or Crossing?.  ECS Transactions. 121-132. 2019
• Electrochemical Characterization of X80 Steel under Sour Environments and Addition of Imidazoline Based Compounds Under Linear Flow Conditions.  ECS Transactions. 181-198. 2019
• Embedding of Nanocrystalline Ruthenium in ZrHfO High-k Film for Nonvolatile Memories.  ECS Transactions. 465-470. 2019
• Failure Analysis of Single and Dual nc-ITO Embedded ZrHfO High-k Nonvolatile Memories.  ECS Transactions. 457-464. 2019
• Hole-Trapping Mechanism and SILC of Dual-Layer nc-ITO Embedded ZrHfO High-k Nonvolatile Memories.  ECS Transactions. 269-276. 2019
• Indium-Tin-Oxide Embedded in Zirconium-Doped Hafnium Oxide High-k Dielectric Films for Hole-Based Nonvolatile Memories.  ECS Transactions. 193-201. 2019
• Influence of Ru Dopant on the Dielectric Properties of Zr-doped HfO2 High-k Thin Film.  ECS Transactions. 121-127. 2019
• Investigation of Stress and Water Distribution in Membrane Electrode Assembly (MEA) During Fuel Cell Operation.  ECS Transactions. 551-561. 2019
• Light Effects on Charge Trapping and Detrapping of nc-ZnO Embedded ZrHfO High-k MOS Nonvolatile Memories.  ECS Transactions. 93-100. 2019
• Low Energy of Activation Lithium-ion Conducting Channel.  ECS Transactions. 163-167. 2019
• Material and Electrical Properties of Hole-Trapping Memory Capacitors Composed of nc-ITO Embedded ZrHfO High-k Films.  ECS Transactions. 249-255. 2019
• Mechanism of Charge Storage in nc-RuO Embedded ZrHfO High-k Films.  ECS Transactions. 309-316. 2019
• Mixed Oxide High-k Gate Dielectrics - Interface Layer Structure, Breakdown Mechanism, and Memories.  ECS Transactions. 253-263. 2019
• Nonvolatile Amorphous Silicon Thin Film Transistor Memories with the a-Si:H Embedded Gate Dielectric Structure.  ECS Transactions. 333-339. 2019
• Nonvolatile Memories Based on Nanocrystalline Zinc Oxide Embedded Zirconium-doped Hafnium Oxide Thin Films.  ECS Transactions. 509-518. 2019
• Radiation Exposure Effect on Amorphous Silicon Thin Film Transistors.  ECS Transactions. 261-266. 2019
• Reliability of a-Si:H TFTs and Copper Interconnect Lines for Flexible Electronics.  ECS Transactions. 345-351. 2019
• Single and Dual nc-ITO and nc-ZnO Embedded ZrHfO High-k Nonvolatile Memories.  ECS Transactions. 81-87. 2019
• Status Review of Nanocrystals Embedded High-K Nonvolatile Memories.  ECS Transactions. 13-31. 2019
• Stress-Induced Deterioration of Nanocrystalline ITO Embedded ZrHfO High-k Nonvolatile Memories.  ECS Transactions. 307-311. 2019
• Sub 2 nm Thick Zirconium Doped Hafnium Oxide High-K Gate Dielectrics.  ECS Transactions. 447-454. 2019
• Super Proton Conductive Nafion Nanofibers: Discovery, Fabrication, Properties, and Fuel Cell Performance.  ECS Transactions. 1503-1506. 2019
• Surface Adsorption and Stabilization Effect of Iridium in Pt-based Alloy Catalysts for PEM Fuel Cell Cathodes.  ECS Transactions. 1037-1044. 2019
• Temperature Influence on Nanocrystals Embedded High-k Nonvolatile Memory Characteristics.  ECS Transactions. 41-47. 2019
• The Challenges in Introducing PMOS Dual Channel in CMOS Processing.  ECS Transactions. 223-231. 2019
• ULSIC vs. TFT - What Can They Learn from Each Other?.  ECS Transactions. 45-50. 2019
• Water Transport in Proton Exchange Membranes: Insights from Time-Resolved Infrared Spectroscopy.  ECS Transactions. 1029-1033. 2019
• Communication—Co-Planar Structured Nano-Resistor Devices.  ECS Journal of Solid State Science and Technology. q223-q225. 2019
• Capping Layer Effect on Lifetime of Plasma Etched Copper Lines.  ECS Transactions. 87-92. 2019
• Co-Planar Nano-Resistor Devices.  ECS Transactions. 71-76. 2019
• Lifetime of Plasma Etched Copper Lines.  ECS Transactions. 65-72. 2019
• Nano-resistor Based Devices – Effects of Size, Structure, and Performance.  ECS Transactions. 171-176. 2019
• (Invited) Illumination Light Wavelength Effects on Double-Gate a-IGZO Thin Film Transistor with Top-Gate-to-Source/Drain Offset Structure.  ECS Transactions. 147-152. 2018
• Electromigration of Plasma Etched Copper Lines of Various Widths and Lengths.  ECS Transactions. 41-47. 2018
• Enhancement of SSI-LED Light Emission by Embedding CdS in the Zr-Doped HfO2 High-k Film.  ECS Transactions. 53-58. 2018
• Plasma-Based Copper Etch Process and Reliability.  ECS Transactions. 165-170. 2018
• Substrate Effect on Light Emission of SSI-LEDs.  ECS Transactions. 191-197. 2017
• Effect of Incident Light Direction and Metallic Reflector Layer on Light Sensing of Amorphous Silicon Pin Diodes.  ECS Transactions. 1753-1759. 2017
• (Invited) Multifunctional Amorphous Metal Oxide Thin Films – Structure Transformation for Various Functions.  ECS Transactions. 21-29. 2017
• Failure Mechanism of Nano-Resistor Devices.  ECS Transactions. 79-83. 2017
• Resistivity and Barrier Height of Nano-Resistors Made from Zr-Doped HfO 2 High- K Dielectric on Si Wafer.  ECS Transactions. 63-68. 2017
• Effect of n+ Layer Deposition Power on Light Sensing of Amorphous Silicon pin Diodes.  ECS Transactions. 33-39. 2016
• Nonvolatile Memory Characteristics of CdS Embedded Zr-Doped HfO2 High-k Dielectric MOS Capacitors.  ECS Transactions. 11-17. 2016
• Temperature Effects on Charge Storage and Transfer of Nanocrystalline CdSe Embedded Zr-Doped HfO2 MOS Memory Device.  ECS Journal of Solid State Science and Technology. q231-q238. 2016
• Light Sensing of a-Si:H Pin Diode - Wavelength and Intensity Effects.  ECS Transactions. 15-20. 2016
• Narrowing of broad band light emitted from a SSI-LED.  ECS Transactions. 17-22. 2016
• (Invited) A Metal Oxide Antifuse-Diode Device.  ECS Transactions. 23-29. 2015
• Post Deposition Annealing Atmosphere Effect on SSI-LEDs Made of Zr-Doped HfO2 High-k Gate Dielectric.  ECS Transactions. 17-22. 2015
• (Gordon E. Moore Medal for Outstanding Achievement in Solid State Science and Technology) Research on Nano and Giga Electronics – Breakthroughs Along the Path.  ECS Transactions. 139-154. 2015
• (Invited) A Diode-Like Antifuse Device Made of High-K Dielectric.  ECS Transactions. 183-189. 2015
• (Invited) Temperature Influence on Current Leakage and Hysteresis of Nc-CdSe Embedded Zr-Doped HfO2 High-k Dielectric Nonvolatile Memory.  ECS Transactions. 195-202. 2015
• Solid State Incandescent Light Emitting Device Made of WOx Embedded Zr-Doped HfO2 High-k Stack on Si.  ECS Transactions. 223-228. 2015
• White-Light Emission SSI-LED Made of Sputter Deposited TiOx Thin Film on Si Wafer.  ECS Transactions. 1-6. 2015
• Post Deposition Annealing Temperature Effect on White-Light Emitting of WOx Thin Film Stack on Si.  ECS Transactions. 1-6. 2014
• (Invited) Thin Film Transistors as Driving Devices for Attached Devices.  ECS Transactions. 145-153. 2014
• Temperature Effect on Memory Functions of the nc-CdSe Embedded ZrHfO High-k MOS Device.  ECS Transactions. 125-131. 2014
• Electrochemical, Catalytic and O2-Permeation Studies of Iron-Doped Barium Zirconates for Membrane Reactor Applications.  ECS Transactions. 307-318. 2014
• Light Wavelength Effects on Charge Trapping and Detrapping of AlOx Embedded ZrHfO High-K Stack.  ECS Transactions. 169-175. 2014
• White-Light Emission from Amorphous ZrHfO Thin Film Dielectrics with and without Embedded Nanocrystalline CdSe Dots.  ECS Transactions. 55-60. 2014
• CdSe Embedded ZrHfO Gate Dielectric Nonvolatile Memories – Charge Trapping and Breakdown Studies.  ECS Transactions. 109-113. 2013
• Light Wavelength Effect on Tungsten Oxide Dielectric Properties.  ECS Transactions. 259-263. 2013
• Memristive Devices for Computing: Mechanisms, Applications and Challenges.  ECS Transactions. 9-14. 2013
• (Invited) Metal Oxide High-k Thin Films – from Gate Dielectrics to Nonvolatile Memories to LEDs.  ECS Transactions. 273-281. 2013
• (Invited) Nanocrystals Embedded High-k Nonvolatile Memories – Bulk Film and Nanocrystal Material Effects.  ECS Transactions. 121-128. 2013
• Electrochemical Characterization of UNS N08367 and UNS S31603 Alloys in Presence of Chloride and Bromide Solutions.  ECS Transactions. 227-240. 2013
• Engineering the Abio-Bio Interface to Enable More than Moore in Functional Bioelectronics.  ECS Transactions. 13-29. 2013
• Managing Basal Plane Dislocations in SiC: Perspective and Prospects.  ECS Transactions. 103-108. 2013
• Nanocrystalline MoOx Embedded ZrHfO High-k Memories - Charge Trapping and Retention Characteristics.  ECS Transactions. 203-209. 2012