Nucleation of In-Grown Stacking Faults and Dislocation Half Loops in 4H-SiC Epilayers Deposited at High Growth Rate Academic Article

abstract

• Abstract not Available.

authors

• Nyakiti, Luke

published proceedings

• ECS Meeting Abstracts

author list (cited authors)

• Abadier, M., Myers-Ward, R. L., Mahadik, N. A., Stahlbush, R. E., Wheeler, V. D., Nyakiti, L. O., ... Skowronski, M.

citation count

• 0

complete list of authors

• Abadier, M||Myers-Ward, Rachael L||Mahadik, Nadeemullah A||Stahlbush, Robert E||Wheeler, Virginia D||Nyakiti, Luke O||Eddy, Charles R||Gaskill, Kurt||Song, Haizheng||Sudarshan, Tangali S||Picard, Yoosuf N||Skowronski, Marek

publication date

• January 2013

publisher

• The Electrochemical Society  Publisher

published in

• ECS Meeting Abstracts  Journal

Digital Object Identifier (DOI)

• 10.1149/ma2013-02/25/1907

start page

• 1907

end page

• 1907

volume

• MA2013-02

issue

• 25

URL

• http://dx.doi.org/10.1149/ma2013-02/25/1907