Nucleation of In-Grown Stacking Faults and Dislocation Half Loops in 4H-SiC Epilayers Deposited at High Growth Rate Academic Article uri icon

abstract

  • Abstract not Available.

published proceedings

  • ECS Meeting Abstracts

author list (cited authors)

  • Abadier, M., Myers-Ward, R. L., Mahadik, N. A., Stahlbush, R. E., Wheeler, V. D., Nyakiti, L. O., ... Skowronski, M.

publication date

  • January 1, 2013 11:11 AM