publication venue for
- Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. 729-738. 2000
- Schmitt Trigger-Based Key Provisioning for Locking Analog/RF Integrated Circuits 2020
- Breaking Analog Locking Techniques via Satisfiability Modulo Theories 2019
- VLSI Testing based Security Metric for IC Camouflaging 2013
- IEEE Std 1581 - A Standardized Test Access Methodology for Memory Devices 2011
- Non-Invasive RF Built-in Testing Using On-chip Temperature Sensors 2009
- The essential role of test in DFM 2007
- The essential role of test in DFM 2007
- Comparison of Delay Tests on Silicon 2006
- Power supply noise in delay testing 2006
- IEEE P1581 - Getting More Board Test Out of Boundary Scan 2006
- Comparison of delay tests on silicon 2006
- An Optimal Test Pattern Selection Method to Improve the Defect Coverage 2005
- A Vector-Based Approach for Power Supply Noise Analysis in Test Compaction 2005
- Efficient SAT-based Combinational ATPG using Multi-level Don't-Cares 2005
- IDDQ Test Using Built-In Current Sensing of Supply Line Voltage Drop 2005
- Verifying Flying Prober Performance - Fitness is Survival 2005
- K longest paths per gate (KLPG) test generation for scan-based sequential circuits 2004
- An Efficient Algorithm for Finding the K Longest Testable Paths Through Each Gate in a Combinational Circuit 2003
- A practical built-in current sensor for I-DDQ testing 2001
- FedEx - A fast bridging fault extractor 2001
- Improved wafer-level spatial analysis for I-DDQ limit setting 2001
- Si-emulation: System verification using simulation and emulation 2000
- Resistive bridge fault modeling, simulation and test generation 1999
- Design for Yield and Reliability is MORE Important Than DFT 1999
- Detection of bridging faults in logic resources of configurable FPGAs using I-DDQ 1998
- Fault coverage analysis for physically-based CMOS bridging faults at different power supply voltages 1996
- Test generation for global delay faults 1996
- IC performance prediction system 1995
- Yield learning via functional test data 1995