Non-Invasive RF Built-in Testing Using On-chip Temperature Sensors Conference Paper

abstract

• This poster shows how to efficiently observe highfrequency figures ofmerit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors. 2009 IEEE.

name of conference

• 2009 International Test Conference

authors

• Silva-Martinez, Jose

published proceedings

• 2009 International Test Conference

author list (cited authors)

• Aldrete, E., Altet, J., Mateo, D., Onabajo, M., & Silva-Martinez, J.

citation count

• 0

complete list of authors

• Aldrete, E||Altet, J||Mateo, D||Onabajo, M||Silva-Martinez, J

publication date

• November 2009

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

Digital Object Identifier (DOI)

• 10.1109/test.2009.5355901

International Standard Book Number (ISBN) 13

• 9781424448678

start page

• 1

end page

• 1

volume

• 1

URL

• http://dx.doi.org/10.1109/test.2009.5355901