Non-Invasive RF Built-in Testing Using On-chip Temperature Sensors Conference Paper uri icon

abstract

  • This poster shows how to efficiently observe highfrequency figures ofmerit in RF circuits by measuring DC temperature with CMOS-compatible built-in sensors. © 2009 IEEE.

author list (cited authors)

  • Aldrete, E., Altet, J., Mateo, D., Onabajo, M., & Silva-Martinez, J.

citation count

  • 0

complete list of authors

  • Aldrete, E||Onabajo, M||Altet, J||Mateo, D||Silva-Martinez, J

publication date

  • November 2009

publisher