Comparison of delay tests on silicon Conference Paper

authors

• Walker, Duncan

published proceedings

• 2006 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2

author list (cited authors)

• Qiu, W., Walker, D., Simpson, N., Reddy, D., & Moore, A.

complete list of authors

• Qiu, Wangqi||Walker, DMH||Simpson, Neil||Reddy, Divya||Moore, Anthony

publication date

• 2006

published in

• International Test Conference  Journal

International Standard Book Number (ISBN) 13

• 978-1-4244-0291-5

start page

• 347

end page

• +