A practical built-in current sensor for I/sub DDQ/ testing Conference Paper uri icon

abstract

  • This paper describes a new built-in current sensor (BICS) design, comprised of a MAGFET current sensor, stochastic sensor, self-calibration tool, counter, and scan chain. By indirectly measuring the current, the sensor avoids the unacceptable drawbacks of past BICS designs. Test chips fabricated in 180 nm and 250 nm technology demonstrate that the sensor can be used for IDDQ testing of large, high-performance, deep sub-micron circuits. This sensor should extend practical IDDQ testing to the 35 nm technology generation.

name of conference

  • International Test Conference

published proceedings

  • Proceedings International Test Conference 2001 (Cat. No.01CH37260)

author list (cited authors)

  • Hoki Kim, .., Walker, D., & Colby, D.

citation count

  • 20

complete list of authors

  • Walker, DMH||Colby, D

publication date

  • January 2001

publisher