A practical built-in current sensor for I-DDQ testing Conference Paper

abstract

• This paper describes a new built-in current sensor (BICS) design, comprised of a MAGFET current sensor, stochastic sensor, self-calibration tool, counter, and scan chain. By indirectly measuring the current, the sensor avoids the unacceptable drawbacks of past BICS designs. Test chips fabricated in 180 nm and 250 nm technology demonstrate that the sensor can be used for IDDQ testing of large, high-performance, deep sub-micron circuits. This sensor should extend practical IDDQ testing to the 35 nm technology generation.

name of conference

• Proceedings International Test Conference 2001 (Cat. No.01CH37260)

authors

• Walker, Duncan

published proceedings

• INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS

author list (cited authors)

• Kim, H., Walker, D., & Colby, D.

citation count

• 20

complete list of authors

• Kim, H||Walker, DMH||Colby, D

publication date

• January 2001

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

keywords

• 4 Detection, Screening And Diagnosis
• 4.1 Discovery And Preclinical Testing Of Markers And Technologies
• 40 Engineering
• 4009 Electronics, Sensors And Digital Hardware
• Bioengineering
• Generic Health Relevance

Digital Object Identifier (DOI)

• 10.1109/TEST.2001.966657

International Standard Book Number (ISBN) 10

• 0-7803-7169-0

start page

• 405

end page

• 414

URL

• http://dx.doi.org/10.1109/test.2001.966657