An Optimal Test Pattern Selection Method to Improve the Defect Coverage Conference Paper

abstract

• It is well known that n-detection test sets are effective to detect unmodeled defects and improve the defect coverage. However, in these sets, each of the n-detection test patterns has the same importance on the overall test set performance. In other words, the test pattern that detects a fault for the rst time plays the same important role as the test pattern that detects that fault for the (n)-th time. In this paper, we propose a linear programming-based optimal test pattern selection method which aims at reducing the overall defect part level (DPL). Using resistive bridge faults as surrogates, our experimental results on ISCAS85 circuits demonstrate the proposed test pattern selection method achieves a higher defect coverage than traditional n-detection method. 2005 IEEE.

name of conference

• IEEE International Conference on Test, 2005.

authors

• Shi, Weiping

published proceedings

• IEEE International Conference on Test, 2005.

author list (cited authors)

• Tian, Y., Grimaila, M. R., Shi, W., & Mercer, M. R.

citation count

• 10

complete list of authors

• Tian, Yuxin||Grimaila, Michael R||Shi, Weiping||Mercer, M Ray

publication date

• January 2005

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

Digital Object Identifier (DOI)

• 10.1109/test.2005.1584039

International Standard Book Number (ISBN) 10

• 0780390393

International Standard Book Number (ISBN) 13

• 9780780390393

start page

• 1

end page

• 9

volume

• 2005

URL

• http://dx.doi.org/10.1109/test.2005.1584039