Fault coverage analysis for physically-based CMOS bridging faults at different power supply voltages Conference Paper

abstract

• Bridging faults in CMOS circuits sometimes degrade the output voltage and time performance without altering the logic function. The traditional voltage testing models based on the normal power supply voltage do not accurately model this behavior. In this paper we develop a model of bridging faults that accounts for both the bridging resistance distribution and gate sensitization and propagation choices. This model shows that fault coverage increases at lower power supply voltages. It suggests that decreasing the power supply voltage is a promising technique to maximize the real fault coverage of voltage tests, thereby minimizing the number of relatively slow Iddq tests required to achieve high quality.

name of conference

• Proceedings International Test Conference 1996. Test and Design Validity

authors

• Walker, Duncan

published proceedings

• INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS

author list (cited authors)

• Liao, Y. Y., & Walker, D.

citation count

• 33

complete list of authors

• Liao, YY||Walker, DMH

publication date

• January 1996

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 4009 Electronics, Sensors And Digital Hardware

Digital Object Identifier (DOI)

• 10.1109/TEST.1996.557136

International Standard Book Number (ISBN) 10

• 0-7803-3541-4

start page

• 767

end page

• 775

URL

• http://dx.doi.org/10.1109/test.1996.557136