IEEE Std 1581 — A standardized test access methodology for memory devices Conference Paper uri icon

abstract

  • Memory devices have been becoming more complex with every generation and this trend is very likely to continue. Different kinds of memories present different challenges for board level test applications. In this paper we discuss several of those challenges and will introduce a new test technology standardized as IEEE Std 1581, offering an elegant solution to many problems related to the test of the board and system level connectivity at memory device pins. 2011 IEEE.

name of conference

  • 2011 IEEE International Test Conference (ITC)

published proceedings

  • 2011 IEEE International Test Conference

author list (cited authors)

  • Ehrenberg, H., & Russell, B.

publication date

  • January 1, 2011 11:11 AM

publisher