IEEE Std 1581 - A Standardized Test Access Methodology for Memory Devices Conference Paper

abstract

• Memory devices have been becoming more complex with every generation and this trend is very likely to continue. Different kinds of memories present different challenges for board level test applications. In this paper we discuss several of those challenges and will introduce a new test technology standardized as IEEE Std 1581, offering an elegant solution to many problems related to the test of the board and system level connectivity at memory device pins. 2011 IEEE.

name of conference

• 2011 IEEE International Test Conference

authors

• Russell, B. Don

published proceedings

• 2011 IEEE International Test Conference

author list (cited authors)

• Ehrenberg, H., & Russell, B.

citation count

• 5

complete list of authors

• Ehrenberg, Heiko||Russell, Bob

publication date

• January 2011

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

Digital Object Identifier (DOI)

• 10.1109/test.2011.6139141

start page

• 1

end page

• 9

URL

• http://dx.doi.org/10.1109/test.2011.6139141