Schmitt Trigger-Based Key Provisioning for Locking Analog/RF Integrated Circuits Conference Paper

name of conference

• 2020 IEEE International Test Conference (ITC)

authors

• Rajendran, Jeyavijayan

published proceedings

• 2020 IEEE INTERNATIONAL TEST CONFERENCE (ITC)

author list (cited authors)

• Sanabria-Borbon, A., Jayasankaran, N. G., Lee, S., Sanchez-Sinencio, E., Hu, J., & Rajendran, J.

citation count

• 5

complete list of authors

• Sanabria-Borbon, A||Jayasankaran, NG||Lee, S||Sanchez-Sinencio, E||Hu, J||Rajendran, J

publication date

• November 2020

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 4009 Electronics, Sensors And Digital Hardware
• 46 Information And Computing Sciences

Digital Object Identifier (DOI)

• 10.1109/ITC44778.2020.9325209

International Standard Book Number (ISBN) 13

• 978-1-7281-9113-3

start page

• 1

end page

• 10

volume

• 00

URL

• http://dx.doi.org/10.1109/itc44778.2020.9325209