IC performance prediction system Conference Paper

abstract

• This paper presents a methodology for predicting the electrical performance of integrated circuits prior to packaging and final test. A simulation-based approach is used to build response surface prediction models. The work focuses on determining the optimal set of test measurements required for on-line product-based control, package selection, binning and die selection for MCMs.

name of conference

• Proceedings of 1995 IEEE International Test Conference (ITC)

authors

• Walker, Duncan

published proceedings

• PROCEEDINGS - INTERNATIONAL TEST CONFERENCE 1995

author list (cited authors)

• Ramakrishnan, V., & Walker, D.

citation count

• 10

complete list of authors

• Ramakrishnan, V||Walker, DMH

publication date

• January 1995

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering

Digital Object Identifier (DOI)

• 10.1109/TEST.1995.529858

International Standard Book Number (ISBN) 10

• 0-7803-2992-9

start page

• 336

end page

• 344

URL

• http://dx.doi.org/10.1109/test.1995.529858