Breaking Analog Locking Techniques via Satisfiability Modulo Theories Conference Paper

name of conference

• 2019 IEEE International Test Conference (ITC)

authors

• Rajendran, Jeyavijayan

published proceedings

• 2019 IEEE INTERNATIONAL TEST CONFERENCE (ITC)

author list (cited authors)

• Jayasankaran, N. G., Borbon, A. S., Abuellil, A., Sanchez-Sinencio, E., Hu, J., & Rajendran, J.

citation count

• 9

complete list of authors

• Jayasankaran, NG||Borbon, A Sanabria||Abuellil, A||Sanchez-Sinencio, E||Hu, J||Rajendran, J

publication date

• November 2019

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

Digital Object Identifier (DOI)

• 10.1109/itc44170.2019.9000113

International Standard Book Number (ISBN) 13

• 978-1-7281-4823-6

start page

• 1

end page

• 10

volume

• 00

URL

• https://ieeexplore.ieee.org/xpl/conhome/8977396/proceeding