Yield learning via functional test data Conference Paper uri icon

abstract

  • This paper presents a methodology to estimate the defect Pareto in an IC process through the use of production functional test data. This Pareto can then be used for yield improvement activities. We demonstrate the concept on several benchmark circuits. We show how limited IDDQ current testing can significantly improve the Pareto accuracy.

published proceedings

  • IEEE International Test Conference (TC)

author list (cited authors)

  • Kwon, Y. J., & Walker, D.

complete list of authors

  • Kwon, YJ||Walker, DMH

publication date

  • December 1995