Yield learning via functional test data Conference Paper

abstract

• This paper presents a methodology to estimate the defect Pareto in an IC process through the use of production functional test data. This Pareto can then be used for yield improvement activities. We demonstrate the concept on several benchmark circuits. We show how limited IDDQ current testing can significantly improve the Pareto accuracy.

name of conference

• Proceedings of 1995 IEEE International Test Conference (ITC)

authors

• Walker, Duncan

published proceedings

• PROCEEDINGS - INTERNATIONAL TEST CONFERENCE 1995

author list (cited authors)

• Kwon, Y. J., & Walker, D.

citation count

• 19

complete list of authors

• Kwon, YJ||Walker, DMH

publication date

• January 1995

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering

Digital Object Identifier (DOI)

• 10.1109/TEST.1995.529891

International Standard Book Number (ISBN) 10

• 0-7803-2992-9

start page

• 626

end page

• 635

URL

• http://dx.doi.org/10.1109/test.1995.529891