FedEx - A fast bridging fault extractor Conference Paper

abstract

• Test pattern generation and diagnosis algorithms that target realistic bridging faults must be provided with a realistic fault list. In this work we describe FedEx, a bridging fault extractor that extracts a circuit from the mask layout, identifies the two-node bridges that can occur, their locations, layers, and relative probability of occurrence. Our experimental results show that FedEx is memory efficient and fast.

name of conference

• Proceedings International Test Conference 2001 (Cat. No.01CH37260)

authors

• Walker, Duncan

published proceedings

• INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS

author list (cited authors)

• Stanojevic, Z., & Walker, D.

citation count

• 27

complete list of authors

• Stanojevic, Z||Walker, DMH

publication date

• January 2001

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 46 Information And Computing Sciences

Digital Object Identifier (DOI)

• 10.1109/TEST.2001.966690

International Standard Book Number (ISBN) 10

• 0-7803-7169-0

start page

• 696

end page

• 703

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Ftest.2001.966690