Design for Yield and Reliability is MORE Important Than DFT Conference Paper uri icon

abstract

  • In the past, the Design For Yield (DFY) and Design for Reliability (DFR) were more important than Design for Test (DFT). Today, this still holds true. To ensure success, more DFY and DFR activity must move earlier in the design process, rather than remain mostly a last-minute physical design check.

author list (cited authors)

  • Walker, D.

citation count

  • 0

publication date

  • January 1999