Design for Yield and Reliability is MORE Important Than DFT Conference Paper uri icon

abstract

  • In the past, the Design For Yield (DFY) and Design for Reliability (DFR) were more important than Design for Test (DFT). Today, this still holds true. To ensure success, more DFY and DFR activity must move earlier in the design process, rather than remain mostly a last-minute physical design check.

name of conference

  • IEEE Computer Society International Test Conference (ICSM'99)

published proceedings

  • International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)

author list (cited authors)

  • Walker, D.

citation count

  • 0

complete list of authors

  • Walker, DMH

publication date

  • January 1999