Design for Yield and Reliability is MORE Important Than DFT Conference Paper

abstract

• In the past, the Design For Yield (DFY) and Design for Reliability (DFR) were more important than Design for Test (DFT). Today, this still holds true. To ensure success, more DFY and DFR activity must move earlier in the design process, rather than remain mostly a last-minute physical design check.

name of conference

• International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)

authors

• Walker, Duncan

published proceedings

• International Test Conference 1999 Proceedings (IEEE Cat No99CH37034)

author list (cited authors)

• Walker, D.

citation count

• 0

complete list of authors

• Walker, DMH

publication date

• January 1999

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

Digital Object Identifier (DOI)

• 10.1109/test.1999.805877

start page

• 1146

end page

• 1146

URL

• http://dx.doi.org/10.1109/test.1999.805877