Power Supply Noise in Delay Testing Conference Paper uri icon


  • Excessive power supply noise can affect path delay and cause overkill during delay test. This paper presents lowcost noise models for fast power supply noise analysis and timing analysis considering noise impact. Our prior work only considered array-bond chips. This work proposes a noise analysis methodology that can be applied to wirebond chips as well as array-bond chips. Experiments were performed on an industrial design. Silicon results show as much as a 15% delay variation due to different don't care fill approaches. The power supply noise impact on delay must be taken into account when delay tests are applied. 2006 IEEE.

name of conference

  • 2006 IEEE International Test Conference

published proceedings

  • 2006 IEEE International Test Conference

author list (cited authors)

  • Wang, J., H. Walker, D. M., Majhi, A., Kruseman, B., Gronthoud, G., Villagra, L. E., van de Wiel, P., & Eichenberger, S.

citation count

  • 66

complete list of authors

  • Wang, Jing||H. Walker, DM||Majhi, Ananta||Kruseman, Bram||Gronthoud, Guido||Villagra, Luis Elvira||van de Wiel, Paul||Eichenberger, Stefan

publication date

  • October 2006