K longest paths per gate (KLPG) test generation for scan-based sequential circuits Conference Paper uri icon

abstract

  • To detect the smallest delay faults at a fault site, the longest path(s) through it must be tested at full speed. Existing test generation tools are inefficient in automatically identifying the longest testable paths due to the high computational complexity. In this work a test generation methodology for scan-based synchronous sequential circuits is presented, under two at-speed test strategies used in industry. The two strategies are compared and the test generation efficiency is evaluated on ISCAS89 benchmark circuits and industrial designs. Experiments show that testing transition faults through the longest paths can be done in reasonable test set size.

name of conference

  • International Test Conference 2004

published proceedings

  • 2004 International Conferce on Test

author list (cited authors)

  • Qiu, W., Jing Wang, .., Walker, D., Reddy, D., Xiang Lu, .., Zhuo Li, .., Weiping Shi, .., & Balachandran, H.

citation count

  • 84

complete list of authors

  • Qiu, W||Walker, DMH||Reddy, D||Balachandran, H

publication date

  • January 2004

publisher