IDDQ Test Using Built-In Current Sensing of Supply Line Voltage Drop Conference Paper

abstract

• A practical built-in current sensor (BICS) is described that senses the voltage drop on supply lines caused by quiescent current leakage. This non-invasive procedure avoids any performance degradation. The sensor performs analog-to-digital conversion of the input signal using a stochastic process, with scan chain readout. Self-calibration and digital chopping are used to minimize offset and low frequency noise and drift. The measurement results of a 350 nm test chip are described. The sensor achieves a resolution of 182 A, with the promise of much higher resolution. 2005 IEEE.

name of conference

• IEEE International Conference on Test, 2005.

authors

• Walker, Duncan

published proceedings

• IEEE International Conference on Test, 2005.

altmetric score

• 3

author list (cited authors)

• Xue, B., & Walker, D.

citation count

• 6

complete list of authors

• Xue, Bin||Walker, DMH

publication date

• January 2005

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• International Test Conference  Journal

keywords

• Bioengineering
• Neurosciences

Digital Object Identifier (DOI)

• 10.1109/test.2005.1584061

International Standard Book Number (ISBN) 10

• 0780390393

International Standard Book Number (ISBN) 13

• 9780780390393

start page

• 1

end page

• 10

volume

• 2005

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Ftest.2005.1584061