I/sub DDQ? test using built-in current sensing of supply line voltage drop Conference Paper uri icon

abstract

  • A practical built-in current sensor (BICS) is described that senses the voltage drop on supply lines caused by quiescent current leakage. This non-invasive procedure avoids any performance degradation. The sensor performs analog-to-digital conversion of the input signal using a stochastic process, with scan chain readout. Self-calibration and digital chopping are used to minimize offset and low frequency noise and drift. The measurement results of a 350 nm test chip are described. The sensor achieves a resolution of 182 A, with the promise of much higher resolution. 2005 IEEE.

name of conference

  • IEEE International Conference on Test, 2005.

published proceedings

  • IEEE International Conference on Test, 2005.

altmetric score

  • 3

author list (cited authors)

  • Bin Xue, .., & Walker, D.

citation count

  • 6

complete list of authors

  • Walker, DMH

publication date

  • January 2005

publisher