A vector-based approach for power supply noise analysis in test compaction Conference Paper uri icon

abstract

  • Excessive power supply noise can lead to overkill during delay test. A static test vector compaction solution is described to prevent such overkill. Low-cost power supply noise models are developed and used in compaction. An error analysis of these models is given. This paper improves on prior work in terms of models and algorithm to increase accuracy and performance. Experimental results are given on ISCAS89 circuits. 2005 IEEE.

name of conference

  • IEEE International Conference on Test, 2005.

published proceedings

  • IEEE International Conference on Test, 2005.

author list (cited authors)

  • Jing Wang, .., Ziding Yue, .., Xiang Lu, .., Wangqi Qiu, .., Weiping Shi, .., & Walker, D.

citation count

  • 24

complete list of authors

  • Walker, DMH

publication date

  • January 2005

publisher