Computer-aided fault to defect mapping (CAFDM) for defect diagnosis Academic Article uri icon

abstract

  • Defects diagnosis in random logic is currently done using the stuck-at fault model, while most defects seen in manufacturing result in bridging faults. In this work we use physical design and test failure information combined with bridging and stuck-at fault models to localize defects in random logic. We term this approach computer-aided fault to defect mapping (CAFDM). We build on top of the existing mature stuck-at diagnosis infrastructure. The performance of the CAFDM software was tested by injecting bridging faults into samples of a streaming audio controller chip and comparing the predicted defect locations and layers with the actual values. The correct defect location and layer was predicted in all 9 samples for which scan-based diagnosis could be performed. The experiment was repeated on production samples that failed scan test, with promising results.

published proceedings

  • Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)

author list (cited authors)

  • Stanojevic, Z., Balachandran, H., Walker, D., Lakbani, F., Jandhyala, S., Saxena, J., & Butler, K. M.

citation count

  • 11

complete list of authors

  • Stanojevic, Z||Balachandran, H||Walker, DMH||Lakbani, F||Jandhyala, S||Saxena, J||Butler, KM

publication date

  • January 2000