publication venue for
- Prediction of processing maps for transient liquid phase diffusion bonding of Cu/Sn/Cu joints in microelectronics packaging. 54:1401-1411. 2014
- Electrical reliability aspects of HfO2 high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress. 46:69-76. 2006
- A relation model of gate oxide yield and reliability. 44:425-434. 2004
- Noise in nanotechnology. 40:1833-1837. 2000
- A biased percolation model for the analysis of electronic-device degradation. 38:515-521. 1998
- A percolative simulation of dielectric-like breakdown. 38:249-253. 1998
- Reliability analysis of hypercube multicomputers. 37:885-891. 1997
- Reliability evaluation of multistage interconnection networks with multi-state elements. 36:423-428. 1996
- A NEW MATHEMATICAL APPROACH TO MULTIAREA POWER-SYSTEM RELIABILITY EVALUATION. 35:73-80. 1995
- RELIABILITY MODELING OF FLEXIBLE MANUFACTURING SYSTEMS. 34:1203-1220. 1994
- PARAMETER DETERMINATION FOR A PARALLEL DEVICE OF STAGES. 27:629-630. 1987
- AVAILABILITY ANALYSIS OF A 2 UNIT REPAIRABLE PARALLEL REDUNDANT SYSTEM WITH COMMON-MODE FAILURES AND ARBITRARILY DISTRIBUTED DOWN TIMES. 26:1183-1188. 1986
- FRACTIONAL DURATION BEFORE 1ST FAILURE - A USEFUL INDEX AND AN ANALYTICAL TOOL. 24:1077-1085. 1984
- COMPARISON OF MEAN TIME TO 1ST FAILURE AND MEAN UP TIME. 23:79-90. 1983
- RELIABILITY MODELING OF TMR COMPUTER-SYSTEMS WITH REPAIR AND COMMON-MODE FAILURES. 21:259-262. 1981
- MATRIX APPROACH TO CALCULATE THE FAILURE FREQUENCY AND RELATED INDEXES. 19:395-398. 1979
- On fault trees and other reliability evaluation methods. 19:57-63. 1979
- Bibliography of literature on fault trees. 17:501-503. 1978
- Generalized conditional frequency formula. 18:351-352. 1978
- Reliability analysis of an mn system with inspections. 16:691-697. 1977
- Reliability modeling algorithms for a class of large repairable systems. 15:159-162. 1976
- Tie set approach to determine the frequency of system failure. 14:293-294. 1975
- Reliability analysis of large repairable systems. 13:487-493. 1974
- A new method to determine the failure frequency of a complex system. 12:459-465. 1973