Noise in nanotechnology Academic Article

abstract

• The length scales dominating physical phenomena in nanotechnology are at the boundary of the macroscopic and microscopic world. Nanoobject formation is governed by a competition between deterministic and random forces. Therefore, classical physical noise phenomena play an important role in determining structural formations and noise measurements can be used as important tools of nanotechnology. 2000 Elsevier Science Ltd. All rights reserved.

authors

• Kish, Laszlo

published proceedings

• Microelectronics Reliability

altmetric score

• 3

author list (cited authors)

• Kish, L. B., & Granqvist, C. G.

citation count

• 12

complete list of authors

• Kish, LB||Granqvist, CG

publication date

• January 2000

publisher

• Elsevier  Publisher

published in

• Microelectronics Reliability  Journal

keywords

• Bioengineering
• Nanotechnology

Digital Object Identifier (DOI)

• 10.1016/s0026-2714(00)00063-9

start page

• 1833

end page

• 1837

volume

• 40

issue

• 11