A percolative simulation of dielectric-like breakdown
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Microelectronics Reliability
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Pennetta, C., Gingl, Z., Kiss, L. B., Reggiani, L., Cola, A., De Vittorio, M., & Mazzer, M.
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Pennetta, C||Gingl, Z||Kiss, LB||Reggiani, L||Cola, A||De Vittorio, M||Mazzer, M
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http://dx.doi.org/10.1016/s0026-2714(97)00046-2