A percolative simulation of dielectric-like breakdown Academic Article uri icon

published proceedings

  • Microelectronics Reliability

author list (cited authors)

  • Pennetta, C., Gingl, Z., Kiss, L. B., Reggiani, L., Cola, A., De Vittorio, M., & Mazzer, M.

citation count

  • 3

complete list of authors

  • Pennetta, C||Gingl, Z||Kiss, LB||Reggiani, L||Cola, A||De Vittorio, M||Mazzer, M

publication date

  • January 1998