A biased percolation model for the analysis of electronic-device degradation Academic Article uri icon

published proceedings

  • Microelectronics Reliability

author list (cited authors)

  • Gingl, Z., Pennetta, C., Kiss, L. B., & Reggiani, L.

citation count

  • 2

complete list of authors

  • Gingl, Z||Pennetta, C||Kiss, LB||Reggiani, L

publication date

  • January 1998