A biased percolation model for the analysis of electronic-device degradation
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Microelectronics Reliability
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Gingl, Z., Pennetta, C., Kiss, L. B., & Reggiani, L.
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Gingl, Z||Pennetta, C||Kiss, LB||Reggiani, L
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http://dx.doi.org/10.1016/s0026-2714(97)00230-8