On fault trees and other reliability evaluation methods Academic Article

abstract

• This paper provides a brief description and comparison of fault trees and several other reliability evaluation methods. It is expected that this material will be useful to reliability engineers in providing a perspective on various methods of reliability analysis. 1978.

authors

• Singh, Chanan

published proceedings

• Microelectronics Reliability

author list (cited authors)

• Dhillon, B. S., & Singh, C.

citation count

• 3

complete list of authors

• Dhillon, Balbir S||Singh, C

publication date

• January 1979

publisher

• Elsevier  Publisher

published in

• Microelectronics Reliability  Journal

Digital Object Identifier (DOI)

• 10.1016/0026-2714(79)90362-7

start page

• 57

end page

• 63

volume

• 19

issue

• 1-2

URL

• http://dx.doi.org/10.1016/0026-2714(79)90362-7