publication venue for
- Keynote 1: Reflections on the risk of human space exploration Lessons learned from past failures 2017
- Data Archiving in 1x-nm NAND Flash Memories: Enabling Long-Term Storage using Rank Modulation and Scrubbing 2016
- Failure analysis of nanocrystals embedded high-k dielectrics for nonvolatile memories 2008
- New Hot-Carrier Degradation Phenomenon in Nano-Scale Floating Body MOSFETs 2008
- Detection of Electron Trap Generation due to Constant Voltage Stress on High- Gate Stacks 2006
- Comparison of NMOS and PMOS stress for determining the source of NBTI in TiN/HfSiON devices 2005
- Effects of post metallization annealing on the electrical reliability of ultra-thin HfO(2) films with MoN and WN gate electrodes 2005