Comparison of NMOS and PMOS stress for determining the source of NBTI in TiN/HfSiON devices Conference Paper uri icon

published proceedings

  • IEEE International Reliability Physics Symposium Proceedings

author list (cited authors)

  • Harris, H. R., Choi, R., Lee, B. H., Young, C. D., Sim, J. H., Mathews, K., ... Bersuker, G.

complete list of authors

  • Harris, HR||Choi, R||Lee, BH||Young, CD||Sim, JH||Mathews, K||Zeitzoff, P||Majhi, P||Bersuker, G

publication date

  • December 2005