Comparison of NMOS and PMOS stress for determining the source of NBTI in TiN/HfSiON devices Conference Paper uri icon

author list (cited authors)

  • Harris, H. R., Choi, R., Lee, B. H., Young, C. D., Sim, J. H., Mathews, K., ... Bersuker, G.

publication date

  • December 2005