Comparison of NMOS and PMOS stress for determining the source of NBTI in TiN/HfSiON devices
Conference Paper
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Overview
published proceedings
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IEEE International Reliability Physics Symposium Proceedings
author list (cited authors)
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Harris, H. R., Choi, R., Lee, B. H., Young, C. D., Sim, J. H., Mathews, K., ... Bersuker, G.
complete list of authors
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Harris, HR||Choi, R||Lee, BH||Young, CD||Sim, JH||Mathews, K||Zeitzoff, P||Majhi, P||Bersuker, G
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International Standard Book Number (ISBN) 10
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