publication venue for
- The achievement of the super short channel control in the magnetic Ge n-FinFETs with the negative capacitance effect. 140:63-65. 2017
- Characterization of Zinc-phthalocyanine-CdS composite thin films for photovoltaic applications. 84:1212-1215. 2010
- Characterization on pulsed laser deposited nanocrystalline ZnO thin films. 84:1199-1203. 2010
- Symposium on advances in semiconducting materials XVI International Materials Research Conference. 84:1181-1181. 2010
- A new, room-temperature, high-rate plasma-based copper etch process. 74:473-477. 2004
- Effects of the TaNx interface layer on doped tantalum oxide high-k films. 74:539-547. 2004
- Effect of carrier gas on the deposition of titanium carbo-nitride coatings by a novel organo-metallic plasma immersion ion processing technique. 67:169-175. 2002
- Plasma-enhanced chemical vapor deposition of silicon nitride below 250 degrees C. 66:299-303. 2002
- Some issues on hydrogen and hydrogenation of plasma enhanced chemical vapor deposited films in a-Si : H thin-film transistors. 59:484-491. 2000
- Surface reactivity studies of bimetallic complexes, (eta(5)-C5Me5)Re(NO)(PPh3)(C equivalent to C)(n)(Ph3P)(ON)Re(eta(5)-C5Me5) (n=2,4,6): candidates for molecular wires. 56:115-121. 2000
- Plasma enhanced chemical vapor deposited silicon nitride as a gate dielectric film for amorphous silicon thin film transistors - a critical review. 51:741-745. 1998
- Reactive ion etching of indium tin oxide by SiCl4- based plasmas - substrate temperature effect. 51:777-779. 1998
- INFLUENCE OF INTRINSIC ELECTRIC-FIELDS ON PASSIVE FILM CHEMISTRY AND STRUCTURE. 46:1397-1399. 1995
- Metal and elastomer seal tests for accelerator applications. 41:1924-1927. 1990
- High temperature compressive properties and microstructure of WC-Ni3Al cermets prepared by spark plasma sintering. 175:109281-109281.
- Sputter deposition of nm-thick films for passivation of organic pellicles 2006
- Modeling and simulation of plasma enhanced processing for integrated circuit fabrication 2002
- A MASS-SPECTROMETRIC METHOD FOR PROBING SURFACE-STRUCTURE 1995
- ANALYSIS OF CAF2-SI(111) USING COAXIAL IMPACT - COLLISION ION-SCATTERING SPECTROSCOPY 1990