Static Compaction of Delay Tests Considering Power Supply Noise Conference Paper uri icon

abstract

  • Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise estimation tool has been built and integrated into the compaction process. Compaction results for KLPG delay tests for ISCAS89 circuits under different power grid environments are presented. © 2005 IEEE.

author list (cited authors)

  • Wang, J., Lu, X., Qiu, W., Yue, Z., Fancler, S., Shi, W., & Walker, D.

citation count

  • 23

publication date

  • January 2005