Static compaction of delay tests considering power supply noise Conference Paper uri icon

abstract

  • Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise estimation tool has been built and integrated into the compaction process. Compaction results for KLPG delay tests for ISCAS89 circuits under different power grid environments are presented. 2005 IEEE.

name of conference

  • 23rd IEEE VLSI Test Symposium (VTS'05)

published proceedings

  • 23RD IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS

author list (cited authors)

  • Wang, J., Lu, X., Qiu, W. Q., Yue, Z. D., Fancler, S., Shi, W. P., & Walker, D.

citation count

  • 23

complete list of authors

  • Wang, J||Lu, X||Qiu, WQ||Yue, ZD||Fancler, S||Shi, WP||Walker, DMH

publication date

  • January 2005