publication venue for
- Special Session: Recent Developments in Hardware Security 2018
- Improved Power Supply Noise Control for Pseudo Functional Test 2014
- Power Supply Noise Control in Pseudo Functional Test 2013
- Levelized Low Cost Delay Test Compaction Considering IR-Drop Induced Power Supply Noise 2011
- Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric 2009
- Dynamic Compaction for High Quality Delay Test 2008
- A CMOS RF RMS Detector for Built-In Testing of Wireless Transceivers 2005
- Static Compaction of Delay Tests Considering Power Supply Noise 2005
- A statistical fault coverage metric for realistic path delay faults 2004
- An On-Chip Transfer Function Characterization System for Analog Built-in Testing 2004
- A Circuit Level Fault Model for Resistive Opens and Bridges 2003
- Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction 2002
- Improvement of SRAM-based failure analysis using calibrated Iddq testing 1996