publication venue for
- Special session: Recent developments in hardware security 2018
- Improved power supply noise control for pseudo functional test 2014
- Power supply noise control in pseudo functional test 2013
- Levelized low cost delay test compaction considering IR-drop induced power supply noise 2011
- Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric 2009
- Dynamic Compaction for High Quality Delay Test 2008
- A CMOS RF RMS Detector for Built-in Testing of Wireless Transceivers 2005
- Static Compaction of Delay Tests Considering Power Supply Noise 2005
- A statistical fault coverage metric for realistic path delay faults 2004
- An on-chip transfer function characterization system for analog built-in testing 2004
- A circuit level fault model for resistive opens and bridges 2003
- Evaluation of effectiveness of median of absolute deviations outlier rejection-based I/sub DDQ/ testing for burn-in reduction 2002
- Improvement of SRAM-based failure analysis using calibrated Iddq testing 1996