publication venue for
- Au/Al Wire Bond Interface Resistance Degradation Rate Simulations. 19:774-781. 2019
- Temperature Effect on Dielectric Breakdown and Charges Retention of Nanocrystalline Cadmium Selenide Embedded Zr-Doped HfO2 High-k Dielectric Thin Film. 16:561-569. 2016
- On short-time-scale stress wave phenomena and initiation of mechanical faults in flip-chip configurations. 5:224-230. 2012
- Dielectric relaxation and breakdown detection of doped tantalum oxide high-k thin films. 4:488-494. 2004