publication venue for
- Au/Al Wire Bond Interface Resistance Degradation Rate Simulations. 19:774-781. 2019
- Temperature Effect on Dielectric Breakdown and Charges Retention of Nanocrystalline Cadmium Selenide Embedded Zr-Doped HfO2 High- ${k}$ Dielectric Thin Film. 16:561-569. 2016
- On Short-Time-Scale Stress Wave Phenomena and Initiation of Mechanical Faults in Flip-Chip Configurations. 5:224-230. 2005
- Dielectric Relaxation and Breakdown Detection of Doped Tantalum Oxide High-k Thin Films. 4:488-494. 2004