On short-time-scale stress wave phenomena and initiation of mechanical faults in flip-chip configurations Academic Article uri icon

published proceedings

  • IEEE Transactions on Device and Materials Reliability

author list (cited authors)

  • Nagaraj, M., & Suh, C. S.

citation count

  • 5

complete list of authors

  • Nagaraj, M||Suh, CS

publication date

  • June 2005