On short-time-scale stress wave phenomena and initiation of mechanical faults in flip-chip configurations
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IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
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Nagaraj, M., & Suh, C. S.
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Device Reliability
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Flip Chip
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Short-time-scale Effects
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Wave Propagation
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http://dx.doi.org/10.1109/tdmr.2005.846828