Twin nucleation from disconnection-dense sites between stacking fault pairs in a random defect network
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Yu, K., Wang, X., Mahajan, S., Beyerlein, I. J., Cao, P., Rupert, T. J., Schoenung, J. M., & Lavernia, E. J.
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Yu, Kehang||Wang, Xin||Mahajan, Subhash||Beyerlein, Irene J||Cao, Penghui||Rupert, Timothy J||Schoenung, Julie M||Lavernia, Enrique J
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40 Engineering
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4016 Materials Engineering
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http://dx.doi.org/10.1016/j.mtla.2023.101835