Topological Heuristics for Scan Test Overhead Reduction Academic Article

authors

• Walker, Duncan

published proceedings

• IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

author list (cited authors)

• Chakraborty, A., & Walker, D.

citation count

• 0

complete list of authors

• Chakraborty, Avijit||Walker, Duncan M Hank

publication date

• June 2023

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems  Journal

keywords

• 40 Engineering
• 4008 Electrical Engineering
• 4009 Electronics, Sensors And Digital Hardware

Digital Object Identifier (DOI)

• 10.1109/tcad.2022.3212643

start page

• 2043

end page

• 2054

volume

• 42

issue

• 6

URL

• http://dx.doi.org/10.1109/tcad.2022.3212643