Topological Heuristics for Scan Test Overhead Reduction Academic Article

authors

• Walker, Duncan

published proceedings

• IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

author list (cited authors)

• Chakraborty, A., & Walker, D.

complete list of authors

• Chakraborty, Avijit||Walker, DMH

publication date

• October 2022

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems  Journal

Digital Object Identifier (DOI)

• 10.1109/tcad.2022.3212643

start page

• 1

end page

• 1

volume

• PP

issue

• 99