NIST-Lite: Randomness Testing of RNGs on an Energy-Constrained Platform Conference Paper

name of conference

• 2021 IEEE 39th International Conference on Computer Design (ICCD)

authors

• Khatri, Sunil

published proceedings

• 2021 IEEE 39TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD 2021)

author list (cited authors)

• Lee, C., Bharathi, K., Lansford, J., & Khatri, S. P.

citation count

• 0

complete list of authors

• Lee, Cheng-Yen||Bharathi, Kunal||Lansford, Joellen||Khatri, Sunil P

publication date

• October 2021

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE International Conference on Computer Design - VLSI in Computers and Processors  Journal

keywords

• Embedded Rngs
• Low Energy
• Nist
• Random Number Generator
• Rng Evaluation

Digital Object Identifier (DOI)

• 10.1109/ICCD53106.2021.00019

start page

• 41

end page

• 48

volume

• 00

URL

• http://dx.doi.org/10.1109/iccd53106.2021.00019