Optimal sequential inspection
Conference Paper
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Overview
published proceedings
- PROCEEDINGS OF THE 45TH IEEE CONFERENCE ON DECISION AND CONTROL, VOLS 1-14
author list (cited authors)
- Pachter, M., Chandler, P. R., Darbha, S., & IEEE.
complete list of authors
- Pachter, Meir||Chandler, Phillip R||Darbha, Swaroop
publication date
- January 1, 2006 11:11 AM