Optimal sequential inspection Conference Paper uri icon

published proceedings

  • PROCEEDINGS OF THE 45TH IEEE CONFERENCE ON DECISION AND CONTROL, VOLS 1-14

author list (cited authors)

  • Pachter, M., Chandler, P. R., Darbha, S., & IEEE.

complete list of authors

  • Pachter, Meir||Chandler, Phillip R||Darbha, Swaroop

publication date

  • January 1, 2006 11:11 AM