Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing Academic Article uri icon

published proceedings

  • Computers & Industrial Engineering

author list (cited authors)

  • Chen, Y., Yuan, T., Bae, S. J., & Kuo, Y.

citation count

  • 0

complete list of authors

  • Chen, Yuan||Yuan, Tao||Bae, Suk Joo||Kuo, Yue

publication date

  • December 2021