Front-End-of-Line Attacks in Split Manufacturing Conference Paper uri icon


  • 2017 IEEE. By splitting the manufacturing of integrated circuits into back-end-of-line (BEOL) and front-end-of-line (FEOL) at different foundries, the vulnerabilities to attacks by a untrusted foundry is considerably alleviated. Most previous works focus on the scenario of only BEOL attacks at untrusted FEOL foundries. In this work, we study a largely unexplored scenario, where FEOL attacks are launched by an untrusted BEOL foundry. A geometric pattern match attack and a machine learningbased attack technique are investigated. Defense techniques against the FEOL attacks are also discussed. The effectiveness of these techniques is demonstrated by experiments on benchmark circuits.

name of conference

  • 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

published proceedings

  • 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

author list (cited authors)

  • Wang, Y., Cao, T., Hu, J., & Rajendran, J.

citation count

  • 9

complete list of authors

  • Wang, Yujie||Cao, Tri||Hu, Jiang||Rajendran, Jeyavijayan

publication date

  • January 2017