Optimal interconnect diagnosis of wiring networks Academic Article

abstract

• Interconnect diagnosis is an important problem in very large scale integration (VLSI), multichip module (MCM) and printed circuit board (PCB) production. The problem is to detect and locate all the shorts, opens and stuck-at faults among a set of nets using the minimum number of parallel tests. In this paper, we present worst-case optimal algorithms and lower bounds to several open problems in interconnect diagnosis. 1995 IEEE

authors

• Shi, Weiping

published proceedings

• IEEE Transactions on Very Large Scale Integration (VLSI) Systems

author list (cited authors)

• Shi, W., & Fuchs, W. K.

citation count

• 39

complete list of authors

• Shi, Weiping||Fuchs, WK

publication date

• January 1995

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Transactions on Very Large Scale Integration Systems  Journal

Digital Object Identifier (DOI)

• 10.1109/92.407000

start page

• 430

end page

• 436

volume

• 3

issue

• 3

URL

• http://dx.doi.org/10.1109/92.407000