I-DDX-based test methods: A survey Academic Article

abstract

• Supply current measurement-based test is a valuable defect-based test method for semiconductor chips. Both static leakage current (IDDQ) and transient current (IDDT) based tests have the capability of detecting unique defects that improve the fault detection capacity of a test suite. Collectively these test methods are known as IDDXtests. However, due to advances in the semiconductor manufacturing process, the future of these test methods is uncertain. This paper presents a survey of the research reported in the literature to extend the use of IDDXtests to deep sub-micron (DSM) technologies.

authors

• Walker, Duncan

published proceedings

• ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS

altmetric score

• 6

author list (cited authors)

• Sabade, S. S., & Walker, D. M.

citation count

• 41

complete list of authors

• Sabade, SS||Walker, DM

publication date

• April 2004

publisher

• Association for Computing Machinery (ACM)  Publisher

published in

• ACM Transactions on Design Automation of Electronic Systems  Journal

keywords

• Design
• I-ddq Test
• I-ddt Test
• Measurement
• Performance
• Reliability
• Vlsi Testing

Digital Object Identifier (DOI)

• 10.1145/989995.989997

start page

• 159

end page

• 198

volume

• 9

issue

• 2

URL

• http%3A%2F%2Fdx.doi.org%2F10.1145%2F989995.989997