I-DDX-based test methods: A survey Academic Article

abstract

• Supply current measurement-based test is a valuable defect-based test method for semiconductor chips. Both static leakage current (I DDQ ) and transient current (I DDT ) based tests have the capability of detecting unique defects that improve the fault detection capacity of a test suite. Collectively these test methods are known as I DDX tests. However, due to advances in the semiconductor manufacturing process, the future of these test methods is uncertain. This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep sub-micron (DSM) technologies.

authors

• Walker, Duncan

published proceedings

• ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS

altmetric score

• 6

author list (cited authors)

• Sabade, S. S., & Walker, D. M.

citation count

• 41

complete list of authors

• Sabade, SS||Walker, DM

publication date

• April 2004

publisher

• Association for Computing Machinery (ACM)  Publisher

published in

• ACM Transactions on Design Automation of Electronic Systems  Journal

keywords

• Design
• I-ddq Test
• I-ddt Test
• Measurement
• Performance
• Reliability
• Vlsi Testing

Digital Object Identifier (DOI)

• 10.1145/989995.989997

start page

• 159

end page

• 198

volume

• 9

issue

• 2