CROWNE: Current ratio outliers with neighbor estimator Conference Paper

abstract

• 2003 IEEE. Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to screen defective (outlier) chips. However, it is not capable of catching certain defects. Neighboring chips on a wafer have similar fault-free parameters that are correlated through the underlying fabrication process. Based on this observation, an alternative test metric called Neighbor Current Ratio (NCR) was proposed. NCR screens outlier chips based on their nonconformance to local variation in IDDQ. In this paper, we explore the correlation between different vectors that yield CR and NCR values. The effectiveness of NCR along with additional test parameters to screen outlier chips is evaluated using industrial test data.

authors

• Walker, Duncan

published proceedings

• Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

author list (cited authors)

• Sabade, S. S., & Walker, D.

complete list of authors

• Sabade, SS||Walker, DMH

publication date

• January 2003

published in

• Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems  Journal

Digital Object Identifier (DOI)

• 10.1109/TSM.2005.1250104

International Standard Book Number (ISBN) 10

• 0769520421

start page

• 132

end page

• 139

volume

• 2003-January