At-Speed Test for Path Delay Faults using Practical Techniques Conference Paper uri icon

abstract

  • To detect the smallest delay faults at a fault site, the longest path(s) through it must be tested at full speed. Most existing test generation tools are either inefficient in automatically identifying the longest testable paths due to the high computational complexity or do not support at-speed test using existing practical design-for-testability structures, such as scan design. In this work a test generation methodology for scan-based synchronous sequential circuits is presented, under two at-speed test strategies used in industry. The two strategies are compared and the test generation efficiency is evaluated on the ISCAS89 benchmark circuits. ©2004 IEEE.

author list (cited authors)

  • Qiu, W., Wang, J., Lu, X., Li, Z., Walker, D., & Shi, W.

citation count

  • 3

publication date

  • January 2004

publisher