Minimizing defective part level using a linear programming-based optimal test selection method Conference Paper uri icon


  • 2003 IEEE. Recent probabilistic test generation approaches have proven that detecting single stuck-at-faults multiple times is effective at reducing the defective part level (DPL). Unfortunately, these test generation strategies increase the number of test patterns. In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based upon the MPG-D model. Our experimental results show that the proposed method is on average 300 times faster than the existing test pattern selection method.

name of conference

  • Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03

published proceedings


author list (cited authors)

  • Tian, Y. X., Grimaila, M. R., Shi, W. P., & Mercer, M. R.

citation count

  • 1

complete list of authors

  • Tian, YX||Grimaila, MR||Shi, WP||Mercer, MR

publication date

  • January 2003