Minimizing Defective Part Level using a Linear Programming-Based Optimal Test Selection Method Conference Paper uri icon


  • © 2003 IEEE. Recent probabilistic test generation approaches have proven that detecting single stuck-at-faults multiple times is effective at reducing the defective part level (DPL). Unfortunately, these test generation strategies increase the number of test patterns. In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based upon the MPG-D model. Our experimental results show that the proposed method is on average 300 times faster than the existing test pattern selection method.

author list (cited authors)

  • Tian, Y., Grimaila, M. R., Shi, W., & Mercer, M. R.

citation count

  • 1

publication date

  • January 2003