Minimizing defective part level using a linear programming-based optimal test selection method Conference Paper

abstract

• 2003 IEEE. Recent probabilistic test generation approaches have proven that detecting single stuck-at-faults multiple times is effective at reducing the defective part level (DPL). Unfortunately, these test generation strategies increase the number of test patterns. In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based upon the MPG-D model. Our experimental results show that the proposed method is on average 300 times faster than the existing test pattern selection method.

name of conference

• Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03

authors

• Shi, Weiping

published proceedings

• ATS 2003: 12TH ASIAN TEST SYMPOSIUM, PROCEEDINGS

author list (cited authors)

• Tian, Y. X., Grimaila, M. R., Shi, W. P., & Mercer, M. R.

citation count

• 1

complete list of authors

• Tian, YX||Grimaila, MR||Shi, WP||Mercer, MR

publication date

• January 2003

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• Proceedings of the Asian Test Symposium  Journal

keywords

• 4 Detection, Screening And Diagnosis
• 4.1 Discovery And Preclinical Testing Of Markers And Technologies
• 40 Engineering
• 4008 Electrical Engineering
• 46 Information And Computing Sciences

Digital Object Identifier (DOI)

• 10.1109/ATS.2003.1250836

International Standard Book Number (ISBN) 10

• 0-7695-1951-2

start page

• 354

end page

• 359

volume

• 2003-January

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fats.2003.1250836