Minimizing defective part level using a linear programming-based optimal test selection method
Additional Document Info
2003 IEEE. Recent probabilistic test generation approaches have proven that detecting single stuck-at-faults multiple times is effective at reducing the defective part level (DPL). Unfortunately, these test generation strategies increase the number of test patterns. In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based upon the MPG-D model. Our experimental results show that the proposed method is on average 300 times faster than the existing test pattern selection method.
name of conference
Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03