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DDQ testing of input/output resources of SRAM-based FPGAs. 375-380. 1999 - Probability Model for Faults in Large-Scale Multicomputer Systems**This research is supported in part by the Major Research Plan of National Natural Science Foundation of China, Grant No. 90104028, and by the National Science Foundation of USA under grant CCR-0000206. 2003
- Minimizing defective part level using a linear programming-based optimal test selection method 2003
- GID-testable two-dimensional sequential arrays for self-testing 1993