Teaching The Significance Of Data Correlation In Semiconductor Testing Conference Paper uri icon

abstract

  • Texas A&M University offers a two course sequence in mixed-signal semiconductor testing. Although most educational institutions offer courses in the utilization of electronic devices, very few have the state-of-the-art facilities to investigate the real life device performance. The Semiconductor Test Initiative was created as a natural interconnect between our digital and analog course sequences. Significant support from Texas Instruments, Teradyne, as well as National Instruments allowed the creation of a state-of-the-art semiconductor testing facility to support research and academics. In a real-life scenario, data acquired from a single testing source is suspect until verified using a second trustworthy testing resource. This concept is investigated using two device families: Digital-to-Analog Converters as well as Analog-to-Digital Converters in a course entitled Advanced Mixed-Signal Test and Measurement. Using resources in the Texas Instruments Mixed-Signal Test Laboratory at Texas A&M University, results obtained using National Instruments LabVIEW and DAQ hardware are compared to data obtained using a state-of-the-art Teradyne A567 automated semiconductor tester. Deviations in results obtained using each test resource are investigated. "Damaged" devices are interspersed within a 100 chip set to assure coverage in the student generated test solution as well as demonstrate statistical concepts.

name of conference

  • 2005 Annual Conference Proceedings

published proceedings

  • 2005 Annual Conference Proceedings

author list (cited authors)

  • Fink, R.

citation count

  • 0

complete list of authors

  • Fink, Rainer

publication date

  • January 1, 2005 11:11 AM