Teaching The Importance Of Data Correlation In Engineering Technology Conference Paper uri icon

abstract

  • To meet the needs of the semiconductor test industry, entry-level test engineers must understand the importance of correlation between characterization test equipment and industrial automated test platforms (ATEs). The expectation is that the test engineer should be able to use data from multiple platforms to aid in debugging device designs and test programs. As part of the Semiconductor Testing Initiative, the Electronics Engineering Technology Program at Texas A&M University has begun to address this issue in their mixed-signal test course sequence. Using a DAC0808 digital-to-analog converter as a test chip, students correlate the data between a Teradyne A567 tester and a National Instruments', Inc. test system with Lab VIEW 6i and a PCI-6025E data acquisition card. Several test-related issues are then explored including debugging, limitations of test equipment, and device interface board design constraints.

name of conference

  • 2002 Annual Conference

published proceedings

  • 2002 Annual Conference Proceedings

author list (cited authors)

  • Porter, J., Burnett, D., Warren, M., & Fink, R

complete list of authors

  • Porter, Jay||Burnett, Dana||Warren, Michael||Fink, Rainer

publication date

  • January 1, 2002 11:11 AM