A note on plating efficiency in fluctuation experiments.
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abstract
In estimating mutation rates using the Luria-Delbrck experimental protocol, it is often assumed that all mutant cells survive the plating procedure to form visible mutant colonies. This assumption of perfect plating efficiency may not hold in certain circumstances, but none of the existing estimation methods that adjust for plating efficiency is strictly based on the likelihood principle. To ameliorate this situation, we propose likelihood based algorithms for computing point and interval estimates of mutation rates.