Reduction of vanadium diffusivity within copper grain boundaries due to enhanced binding
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author list (cited authors)
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Liu, T. Y., Sheu, E., Tavakolzadeh, M., Williams, D. J., Baldwin, J. K., & Demkowicz, M. J.
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Liu, TY||Sheu, E||Tavakolzadeh, M||Williams, DJ||Baldwin, JK||Demkowicz, MJ
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40 Engineering
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4016 Materials Engineering
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Neurosciences
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