Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope Academic Article uri icon

published proceedings

  • Microscopy and Microanalysis

author list (cited authors)

  • Zhang, X., Rufner, J. F., LaGrange, T., Castro, R., Schoenung, J. M., Campell, G. H., & van Benthem, K.

complete list of authors

  • Zhang, Xinming||Rufner, Jorgen F||LaGrange, Thomas||Castro, Ricardo HR||Schoenung, Julie M||Campell, Geoffrey H||van Benthem, Klaus

publication date

  • August 2015