On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials Academic Article uri icon

published proceedings

  • Journal of Materials Research

author list (cited authors)

  • Jiang, H. G., Rhle, M., & Lavernia, E. J.

complete list of authors

  • Jiang, HG||Rühle, M||Lavernia, EJ

publication date

  • February 1999